Abstract
This article describes the digital treatments needed to reconstruct spatial information at a 40-nm depth resolution of entire cells from transmission electron microscopic images of serial sections containing laser-induced topographical references. The use of a scanning transmission electron microscope (STEM) allows the acquisition of images with high contrast and good resolution at medium magnification. The scanning of our specimens at video frequencies is an attractive way to link a STEM with an image processing system. The magnetic hysteresis of the spools responsible for the electron scanning induces image deformations that have to be modelized and rectified before registering the images corrected for cutting-induced deformations.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Bron Cph, Gremillet Ph, Launay D, Jourlin M, Gautschi HP, Bächi Th, Schüpbach J (1990a) Three-Dimensional electron microscopy of entire cells. Journal of Microscopy 157(Pt 1): 115–126
Bron Cph, Gremillet Ph, Launay D, Jourlin M, Gautschi HP, Bächi Th, Schüpbach J (1990b) 3D modeling of entire cells by electronic imaging. Proceedings of SPIE Meeting on Electronic Imaging, Santa Clara, CA
Jourlin M, Pinoli JC (1988) A model for logarithmic image processing. Journal of Microscopy 149(Pt 1):21–35
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Gremillet, P., Jourlin, M., Bron, C. et al. Dedicated image analysis techniques for three-dimensional reconstruction from serial sections in electron microscopy. Machine Vis. Apps. 4, 263–270 (1991). https://doi.org/10.1007/BF01815303
Issue Date:
DOI: https://doi.org/10.1007/BF01815303