Skip to main content
Springer Nature Link
Log in

On the recovery of error patterns from signatures obtained in digital system testing

  • Part I Computer Science
  • Published:
BIT Numerical Mathematics Aims and scope Submit manuscript

Abstract

Error patterns are lost in the data compression process inherent in signature analysis. These however contain useful information about the faults in faulty units. The present paper investigates the possibility to recover the lost error patterns from the signatures obtained at the end of a test run. It is shown that, the recovery is possible if the test outcome sequence is not longer than the signature analyser period and if the number of possible error signatures can be reduced to a subset a priori known.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. J. P. Hayes,Check-sum test methods, Proc. Symp. Fault-Tolerant Comp., June 1976, 114–119.

  2. K. P. Parker,Compact testing: Testing with compressed data, Proc. Symp. Fault-Tolerant Comp., June 1976, 93–98.

  3. N. Benowitz et al.,An advanced fault isolation system for digital logic, IEEE trans. Computers, May 1975, 489–497.

  4. B. Koenemann, J. Mucha and G. Zwiehoff,Built-in test for complex digital integrated circuits, IEEE J. Solid State Comp., June 1989, 510–524.

  5. R. A. Frohwerk,Signature analysis: A new digital field service method, Hewlett-Packard Journal, May 1977, 2–8.

  6. R. David,Testing by feedback shift register, IEEE trans. Computers, July 1980, 669–673.

  7. J. E. Smith,Measures of the effectiveness of signature analysis, IEEE trans. Computers, June 1980, 510–514.

  8. C. C. Lefas,Single board computer design for improved testability with signature analysis, Int. J. of Electronics, 1985, vol. 59, 565–575.

    Google Scholar 

  9. T. W. Williams, W. Daehn, M. Grueizner and C. W. Starke,Aliasing errors in signature analysis registers, IEEE Design and Test of Computers magazine, April 1987, 39–44.

  10. W. W. Peterson and E. J. Weldon,Error Correcting Codes, MIT press, 1972.

  11. J. P. Robinson and N. M. Saxena,A unified view of test compression methods, IEEE trans. Comp., vol. C-36, No. 1, 1987, p. 94–99.

    Google Scholar 

  12. E. J. McCluskey,Built-in self test techniques, andBuilt-in self-test structures, IEEE Des. Test Comp., p. 21–28, p. 29–36, 1985.

  13. R. G. Daniels and W. C. Bruce,Built-in self-test trends in Motorola Microprocessors, IEEE Des. Test Comp., p. 64–71, Apr. 1985.

  14. J. L. Carter,The theory of signature testing for VLSI, in Proc. 14th ACM Symp. Theory of Comput., May 1982, p. 66–76.

Download references

Author information

Authors and Affiliations

  1. Dept. of Electronics, Technical University of Crete, 19, Arapaki Str, 176.76, Kallithea, Athens, Greece

    P. P. Nicolaou & C. C. Lefas

Authors
  1. P. P. Nicolaou
    View author publications

    You can also search for this author inPubMed Google Scholar

  2. C. C. Lefas
    View author publications

    You can also search for this author inPubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Nicolaou, P.P., Lefas, C.C. On the recovery of error patterns from signatures obtained in digital system testing. BIT 28, 242–252 (1988). https://doi.org/10.1007/BF01934089

Download citation

  • Received:

  • Revised:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF01934089

CR categories

Keywords