Abstract
A method is presented to solve the partial differential equation for a time dependent drift — diffusion process in a one dimensional finite space. The method is based on an integral equation technique, which is easily solved numerically on a digital computer. This technique has been used to study the transport phenomenon of mobile ions in evaporated dielectrics under influence of an electric field.
Zusammenfassung
Es wird eine Methode vorgelegt, um die partielle Differentialgleichung für einen zeitabhängigen Strömungs-Diffusionsprozeß in einem eindimensionalen endlichen Raum zu lösen. Die Methode beruht auf einer Integralgleichungstechnik, die leicht mit Hilfe von Ziffernrechenanlagen durchgeführt werden kann. Die Technik wurde dazu verwendet, den Transport von beweglichen Ionen in evakuierten Dielectrica unter dem Einfluß eines elektrischen Feldes zu studieren.
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Swystun, E. J., Tickle, A. C.: Instability in vacuum deposited Silicon oxide. IEEE Transactions on Electron DevicesED-14, 760–764 (1967).
Argall, F., Jonscher, A. K.: Dielectric properties of thin films of Aluminium oxide and Silicon oxide. Thin Solid Films2, 185–210 (1968).
Hofstein, S. R.: An investigation of instability and charge motion in metal — Silicon oxide —Silicon structures. IEEE Transactions on Electron DevicesED-13, 222–237 (1966).
Navik, G.: The ionic conductivity in Silicon oxide films. Thin Solid Films6, 145–159 (1970).
De Wilde W., De Mey, G.: Time constant of the voltage step response in thin film capacitors. Physica Status Solidi (a)20, K 147-K 149 (1973).
Anderson, J. C.: Dielectrics, p. 70–71. London: Science Paperbacks 1970.
De Wilde, W.: Apparatus to measure thin film capacitors in the frequency range 0.0075–700 Hz. Journal of Physics E; Scientific instruments6, 619–622 (1973).
Pauwels, H. J., De Mey, G.: Surface to surface transition probabilities in thin film capacitors. Physica Status Solidi (a)24, K 39-K 44 (1974).
Morse, P., Feshbach, H.: Methods of theoretical physics; Part 1, p. 191. New York: Mc Graw-Hill 1953.
Abramowitz, M., Stegun, I.: Handbook of mathematical functions, p. 299. New York: Dover 1965.
Smith, G. D.: Numerical solution of partial differential equations, p. 9. London: Oxford University Press 1971.
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De Mey, G. An integral equation method for the numerical calculation of ion drift and diffusion in evaporated dielectrics. Computing 17, 169–176 (1976). https://doi.org/10.1007/BF02276762
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DOI: https://doi.org/10.1007/BF02276762