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Study on sampling techniques with CMMs

Исследования методик выборки с помошью КИМ

  • Mathematical Research
  • Published:
Reliable Computing

Abstract

Coordinate Measuring Machines (CMMs) coupleds with computers have provided new, powerful capabilities in the field of manufacturing quality control Most CMMs in use today rely on point sampling to evaluate the specified dimensions and tolerances we measure the coordinates in several selected points, and make conclusions about the entire surface. Several different sampling patterns have been proposed. In this paper, we describle theoretical and experimental results on choosing the best sample pattern for practical CMM applications.

Abstract

Координатные измерительные машинл (КИМ) в сочетаини с компьютерами предоставляют новые тцирокие возмжностн в области контроля качества производства. Большинство используемых в настояшее время КИМ примеияют точечую выборку Для оценки заданных размеров и допусков, и е координаты измеряются в несколькисх выо'ранных гочках, и на основанни зтих измерений лелаются выводы о всыeй поверхности, Для зтих гочках, и на основании зтих измерений выборки. В настотШей рао'отеизлагаюгся теоритические и зкспериментальные выводы о выборе иаилучшей модели длр нрактических приложений КХМ.

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Authors and Affiliations

  1. Department of Mechanical & Industrial Engineering, The University of Texas at El Paso, 79968, El Paso, TX, USA

    Thomas J. McLean & David H. Xu

Authors
  1. Thomas J. McLean
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  2. David H. Xu
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McLean, T.J., Xu, D.H. Study on sampling techniques with CMMs. Reliable Comput 1, 275–284 (1995). https://doi.org/10.1007/BF02385258

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  • DOI: https://doi.org/10.1007/BF02385258

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