Abstract
A new approach is presented for easily testable two-dimensional iterative arrays. It is an improvement on GI-testability (Group Identical testability) and is referred to as GID-testability (Group Identical and Different testability). In a GID-testable two-dimensional array, the primaryx andy outputs are organized into groups and every group has more than one output. This is similar to the GI-testable arrays. However, GID-testability not only ensures that identical test responses can be obtained from every output in the same group when an array is fault free, but also ensures that at least one output has different test responses (from the other outputs in a group) when a cell in the array is faulty. Therefore, all faults can be detected under the assumption of a single faulty cell model. It is proved that an arbitrary two-dimensional iterative array is GID-testable if sevenx-states and seveny-states are added to the original flow table of the basic cell of the array.
GID-testability simplifies the response verification of built-in-self-testing in a way similar to PI-and GI-testability[6–9]. Therefore, it is suitable for BIST design.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
Explore related subjects
Discover the latest articles, news and stories from top researchers in related subjects.References
Sridhar T, Hayes J P. A functional approach to testing bit-sliced microprocessors. IEEE Trans on Comput, 1981, C-30(8): 563–670.
Sridhar T, Hayes J P. Design of easily-testable bit-sliced systems. IEEE Trans on Comput, 1981, C-30(11): 842–854.
Friedman A D. Easily testable iterative arrays. IEEE Trans on Comput, 1976, C-25(6): 605–613.
Elhuni H, Vergis A, Kinney L. C-testability of two-dimensional arrays. IEEE Trans on CAD, 1986, CAD-5(4): 573–581.
Huang Weikang, Lombardi F. On an improved design approach for C-testable orthogonal iterative arrays. IEEE Trans on CAD of ICAS, 1988, 7(5): 609–615.
Cerny E, Aboulhamid E M. Built-in-testing of PI-testable iterative arrays. In: Proc of FTCS 13, 1983: 33–36.
Aboulhamid E M, Cerny E. Built-in-testing of one-dimensional iterative arrays. IEEE Trans on Comput, 1984, C-33(6):560–564.
Huang Weikang, Lombardi F. A new approach for self-testing of one-dimensional iterative logic arrays. In: Proc of 5th National IC Test Conference, 1990, China.
Huang Weikang, Lombardi F. A new approach for self-testing of two-dimensional iterative logic arrays. In: Proc of the First Workshop on Diagnosis and Testing, 1990: 1–6, China.
Huang Weikang, Lombardi F.. A C-testability approach for two-dimensional iterative arrays. Int J Electronics, 1988, 64(2): 179–197.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Huang, W., Lombard, F. On GID-testable two-dimensional iterative arrays. J. of Compt. Sci. & Technol. 9, 27–36 (1994). https://doi.org/10.1007/BF02939484
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02939484