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Using virtual ATE model to migrate test programs

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Abstract

Because of high development costs of IC (Integrated Circuit) test programs, recycling existing test programs from one kind of ATE (Automatic Test Equipment) to another or generating directly from CAD simulation modules to ATE is more and more valuable. In this paper, a new approach to migrating test programs is presented. A virtual ATE model based on object-oriented paradigm is developed; it runs Test C++ (an intermediate test control language) programs and TeIF (Test Intermediate Format—an intermediate pattern), migrates test programs among three kinds of ATE (Ando DIC8032, Schlumberger S15 and GenRad 1732) and generates test patterns from two kinds of CAD (Daisy and Panda) automatically.

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Authors and Affiliations

  1. Institute of Computing Technology, The Chinese Academy of Sciences, 100080, Beijing

    Wang Xiaoming & Yang Qiaolin

Authors
  1. Wang Xiaoming
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  2. Yang Qiaolin
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Additional information

Supported by National Research Project of China. (Contract No. 85-703-02-02 Test Development System (TeDS))

Wang Xiaoming received his B.Sc. degree in computer application from Beijing Polytechnic University in 1992. He is now a graduate student in computer application, Institute of Computing Technology, The Chinese Academy of Sciences. His current research interests include VLSI CAT, object-oriented software environment, and visual language.

Yang Qiaolin graduated from Peking University in 1963. He is currently a Professor with Institute of Computing Technology, The Chinese Academy of Sciences. His research interests include object-based computing, visual computing, CAT, and CAD.

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Wang, X., Yang, Q. Using virtual ATE model to migrate test programs. J. of Comput. Sci. & Technol. 10, 289–297 (1995). https://doi.org/10.1007/BF02943498

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  • DOI: https://doi.org/10.1007/BF02943498

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