Skip to main content
Log in

Computing theK-terminal reliability for SONET self-healing rings

  • Regular Papers
  • Published:
Journal of Computer Science and Technology Aims and scope Submit manuscript

Abstract

Synchronous Optical Network (SONET) technology has made highspeed self-healing ring (SHR) architectures practical and economical for the uses in many local exchange carriers’ intra local access transport area telecommunication networks. This paper analyses theK-terminal reliability, i.e., the probability that a subset ofk specific terminal stations of an SONET SHR can communicate, for four types of SONET SHRs and derives theirK-terminal reliability expressions.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. Lee J. Reliability models of a class of self-healing rings.Microelectron. Reliab., 1997, 37: 1179–1183.

    Article  Google Scholar 

  2. Wu T H, Lau R C. A class of self-healing ring architectures for SONET network applications. InProc. IEEE GLOBECOM’90 403.2.1–403.2.8.

  3. Haque I, Kremer W. Raychaudhuri K. Self-healing rings in a synchronous environment.IEEE Magazine Lightwave Telecommunication System, 1991, 3: 30–37.

    Google Scholar 

  4. Yin J, Silio C B.K-terminal reliability in ring networks.IEEE Trans. Reliability, 1994, 43: 389–400.

    Article  Google Scholar 

  5. Ibe O C. Reliability comparison of token-ring network schemes.IEEE Trans. Reliability, 1992, 41: 288–292.

    Article  MATH  Google Scholar 

  6. Wu T H, Sosnosky J. A study of the economics, operations, and applications of SONET self-healing ring architectures. inProc. IEEE GLOBECOM’91, 57.3.1–57.3.7.

  7. Wu T H, Lau R C. A class of self-healing ring architectures for SONET network applications.IEEE Trans. Communication, 1992, 40: 1746–1756.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Additional information

Supported by the National Natural Science Foundation of China.

Kong Fanjia is an Associate Professor of Department of Applied Mathematics at the Northeastern University, Shenyang. He received his B.S. and M.S. degrees in Applied Mathematics in 1987 and 1990, respectively, and received his Ph.D. degree in Computer applications in 1998 from Northeastern University. His research interests are network reliability and fault tolerant computing.

WANG Guangxing was born in 1937 and graduated from the Automatic Control Department, Northeastern University, in 1962. From 1980 to 1982, he was a visiting scholar at Rensselaer Polytechnic Institute, Troy, NY. Now he is a Professor at Northeastern University. His research interests include network reliability, fault tolerant computing, and broadband local area networks. He is the author of over 100 refereed publications.

ZHANG Xiangde is an Associate Professor of Department of Applied Mathematics at the Northeastern University, Shenyang. He received his B.S. degree in Mathematics from Shangdong University in 1983, and M.S. and Ph.D. degrees in Computational Mathematics in 1991 and 1994 from Dalian University of Technology, respectively. Now his research interests are network reliability and fault tolerant computing.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Kong, F., Wang, G. & Zhang, X. Computing theK-terminal reliability for SONET self-healing rings. J. Comput. Sci. & Technol. 14, 580–584 (1999). https://doi.org/10.1007/BF02951878

Download citation

  • Received:

  • Revised:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02951878

Keywords

Navigation