Abstract
The basis of distributed system conformance testing is to test the conformance of each entity with its standard. This paper addresses the approach to entity conformance testing based on concurrent TTCN. First a preliminary framework for entity conformance testing is introduced and a specification model CEBE is presented. Then a test generation method, which could directly derive concurrent TTCN test suite from CEBE, is proposed.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
Explore related subjects
Discover the latest articles, news and stories from top researchers in related subjects.References
Farooqui K, Logrippo L, de Meer Jan. The ISO model for open distributed processing.Computer Networks & ISDN Systems, 1995, 27: special issue.
Loureiro A A Fet al. Checking unstable properties in distributed testing of communication protocols. In9th International Workshop on Testing of Communicating Systems, IFIP, 1996.
Kim M,et al. An approach for testing asynchronous communicating systems. In9th International Workshop on Testing of Communicating Systems, IFIP, 1996.
Wong A C Yet al. A framework for distributed object-oriented testing. In10th International Conference on Formal Description Techniques for Distributed Systems, IFIP, 1997.
Wu J, Chanson S T. Testing sequence derivation based on external behavior expression. In2nd International Workshop on Protocol Test Systems, IFIP, 1989.
Wu J, Chanson S T. Translation from LOTOS and Estelle specifications to extended transition system and its verification. In2nd International Conference on Formal Description Techniques for Distributed Systems, IFIP, 1989.
Derrick Jet al. Supporting ODP—Translating LOTOS to Z. In1st International Workshop on Formal Methods for Open Object-Based Distributed Systems, IFIP, 1996.
Bi J, Wu J, Chen X. Towards the formal model and testing of distributed systems. In10th International Conference on Parallel and Distributed Systems, IASTED, 1998.
Wang J, Hao R, Wu J. TUGEN: An automatic test suite generator integrating data-flow and control-flow methods. InInternational Conference on Communications, IEEE, 1998.
Author information
Authors and Affiliations
Additional information
Supported by the National Natural Science Foundation of China, Grants No. 69473011 and No.69682002.
BI Jun received his B.S., M.S. and Ph.D. degrees from Tsinghua University. He is a lecturer at Dept. of Computer Science and Technology, Tsinghua University. His research interests include high-speed networks and Internet, formal methods, network protocols, and network routing.
WU Jianping received his B.S., M.S. and Ph.D. degrees from TsinghuaUniversity. He is a Professor at Dept. of Computer Science and Technology, Tsinghua University. He is also the director of the CERNET Technical Board. His research interests include high-speed networks and Internet, protocol engineering, network management, and network security.
Rights and permissions
About this article
Cite this article
Bi, J., Wu, J. An approach to concurrent TTCN test generation. J. Comput. Sci. & Technol. 14, 614–618 (1999). https://doi.org/10.1007/BF02951883
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02951883