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A new universal test for bit strings

  • Session 10: Odds and Ends
  • Conference paper
  • First Online:
Information Security and Privacy (ACISP 1996)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 1172))

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Abstract

A new universal statistical test for random bit generators is presented. The test is an attempt to implement the concepts of the next-bit test theory. Given the statistics of a binary string and a small portion of it, the parameter of the test is related to the amount of next bits which can be guessed. The test detects local as well as overall non-random behaviour of the string. It can be applied for all the strings, from rather small to the large. It is easy to implement, and well suited for cryptographic applications.

This project has been supported by the Electronics Research Center of Sharif University of Technology.

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Author information

Authors and Affiliations

  1. Amir-Kabir University of Technology, Tehran, Iran

    Babak Sadeghiyan & Javad Mohajeri

  2. Sharif University of Technology, Tehran, Iran

    Babak Sadeghiyan & Javad Mohajeri

Authors
  1. Babak Sadeghiyan
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  2. Javad Mohajeri
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Editor information

Josef Pieprzyk Jennifer Seberry

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© 1996 Springer-Verlag Berlin Heidelberg

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Sadeghiyan, B., Mohajeri, J. (1996). A new universal test for bit strings. In: Pieprzyk, J., Seberry, J. (eds) Information Security and Privacy. ACISP 1996. Lecture Notes in Computer Science, vol 1172. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0023309

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  • DOI: https://doi.org/10.1007/BFb0023309

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-61991-8

  • Online ISBN: 978-3-540-49583-3

  • eBook Packages: Springer Book Archive

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