Abstract
In this paper, the problem of determining a fault pattern to be catastrophic for unidirectional linear array with k- link redundancy is studied. First, we establish a necessary and sufficient condition for a fault pattern to be catastrophic. Based on this necessary and sufficient condition, we derive an efficient testing algorithm whose complexity is O(mk), where k is the number of bypass links, and m is the number of faults. This testing scheme, which improves the existing O(mk log k) bound, is based on a novel “geometric” approach.
This work was supported in part by Natural Sciences and Engineering Research Council of Canada under Operating Grant A2415.
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Santoro, N., Ren, J., Nayak, A. (1995). On the complexity of testing for catastrophic faults. In: Staples, J., Eades, P., Katoh, N., Moffat, A. (eds) Algorithms and Computations. ISAAC 1995. Lecture Notes in Computer Science, vol 1004. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0015423
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DOI: https://doi.org/10.1007/BFb0015423
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