Abstract
Analog circuit fault diagnosis is widely used to ensure normal operation and fault location electronic equipment. In this study, a new method for fault diagnosis of analog circuits based on classification of Gramian angular summation field and recurrence plot (GAF_RP) images is presented. The proposed method converts the time-response sequence signals of the analog circuit into a GAF_RP image through the Gramian angular summation field, the Gramian angular difference field and the recurrence plot methods. Therefore, more feature information about the time-response sequence signals can be obtained. And the bilinear interpolation method is used to compress the image, which improves the efficiency of neural network training and testing. Finally, an 18-layer residual neural network (ResNet-18) is used to perform feature extraction and learning on the GAF_RP images, to achieve accurate soft fault diagnosis of analog circuits. The simulation and actual experiment verify that this method can realize accurate and reliable soft fault diagnosis of the analog circuit.
Similar content being viewed by others
Data Availability
The data used in this paper are obtained by the general data acquisition method in the field of analog circuit fault diagnosis, which has been described in detail in Sect. 4 of the article. The circuits used by each researcher to construct the dataset may be different. Therefore, the dataset generated during this study is not public, but can be obtained from the corresponding authors upon reasonable requirement.
References
F. Aminian, M. Aminian, H.W. Collins, Analog fault diagnosis of actual circuits using neural networks. IEEE Trans. Instrum. Meas. 51(3), 544–550 (2002)
J.W. Bandler, A.E. Salama, Fault diagnosis of analog circuits. Proc. IEEE 73(8), 1279–1325 (1985)
Y. Chen, S. Su, H. Yang, Convolutional neural network analysis of recurrence plots for anomaly detection. Int. J. Bifurc. Chaos 30(01), 2050002 (2020)
X. Ding, J. Poon, I. Čelanović, A.D. Dominguez-Garcia, Fault detection and isolation filters for three-phase ac-dc power electronics systems. IEEE Trans. Circuits Syst. I Regul. Pap. 60(4), 1038–1051 (2012)
J.-P. Eckmann, S. Oliffson Kamphorst, D. Ruelle et al., Recurrence plots of dynamical systems. World Sci. Ser. Nonlinear Sci. Ser. A 16, 441–446 (1995)
T. Gao, J. Yang, S. Jiang, A novel incipient fault diagnosis method for analog circuits based on gmkl-svm and wavelet fusion features. IEEE Trans. Instrum. Meas. 70, 1–15 (2020)
T. Gao, J. Yang, S. Jiang, A novel fault diagnosis method for analog circuits with noise immunity and generalization ability. Neural Comput. Appl. 33, 10537–10550 (2021)
D. Han, Comparison of commonly used image interpolation methods, in Conference of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013) (Atlantis Press 2013), pp. 1556–1559
N. Hatami, Y. Gavet, J. Debayle, Classification of time-series images using deep convolutional neural networks, in Tenth International Conference on Machine Vision (ICMV 2017), vol. 10696 (SPIE, 2018), pp. 242–249
K. He, X. Zhang, S. Ren, J. Sun, Deep residual learning for image recognition, in Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (2016), pp. 770–778
L. Ji, C. Fu, W. Sun, Soft fault diagnosis of analog circuits based on a resnet with circuit spectrum map. IEEE Trans. Circuits Syst. I Regul. Pap. 68(7), 2841–2849 (2021)
L. Ji, X. Hu, Analog circuit soft-fault diagnosis based on sensitivity analysis with minimum fault number rule. Anal. Integr. Circuits Signal Process. 95, 163–171 (2018)
H. Li, Piecewise aggregate representations and lower-bound distance functions for multivariate time series. Phys. A Stat. Mech. Appl. 427, 10–25 (2015)
Z. Liu, X. Liu, S. Xie, J. Wang, X. Zhou, A novel fault diagnosis method for analog circuits based on multi-input deep residual networks with an improved empirical wavelet transform. Appl. Sci. 12(3), 1675 (2022)
Z. Liu, T. Liu, J. Han, S. Bu, X. Tang, M. Pecht, Signal model-based fault coding for diagnostics and prognostics of analog electronic circuits. IEEE Trans. Ind. Electron. 64(1), 605–614 (2016)
N. Menini, A.E. Almeida, R. Lamparelli, G. Le Maire, J.A. dos Santos, H. Pedrini, M. Hirota, R.S. Torres, A soft computing framework for image classification based on recurrence plots. IEEE Geosci. Remote Sens. Lett. 16(2), 320–324 (2018)
V. Patel, K. Mistree, A review on different image interpolation techniques for image enhancement. Int. J. Emerg. Technol. Adv. Eng. 3(12), 129–133 (2013)
M.G. Pecht, A prognostics and health management roadmap for information and electronics-rich systems. IEICE ESS Fundam. Rev. 3(4), 425–432 (2010)
R. Rezvani, P. Barnaghi, S. Enshaeifar, A new pattern representation method for time-series data. IEEE Trans. Knowl. Data Eng. 33(7), 2818–2832 (2019)
A. Shankar, H.K. Khaing, S. Dandapat, S. Barma, Epileptic seizure classification based on Gramian angular field transformation and deep learning, in 2020 IEEE Applied Signal Processing Conference (ASPCON) (IEEE, 2020), pp. 147–151
S.M. Shokrolahi, A.T.N. Kazempour, A novel approach for fault detection of analog circuit by using improved eemd. Anal. Integr. Circuits Signal Process. 98(3), 527–534 (2019)
D.F. Silva, V.M.A. De Souza, G.E.A.P.A. Batista, Time series classification using compression distance of recurrence plots, in 2013 IEEE 13th International Conference on Data Mining (IEEE, 2013), pp. 687–696
M. Tadeusiewicz, S. Hałgas, A method for multiple soft fault diagnosis of linear analog circuits. Measurement 131, 714–722 (2019)
P.I. Terrill, S.J. Wilson, S. Suresh, D.M. Cooper, C. Dakin, Attractor structure discriminates sleep states: recurrence plot analysis applied to infant breathing patterns. IEEE Trans. Biomed. Eng. 57(5), 1108–1116 (2010)
A. Viveros-Wacher, J.E. Rayas-Sánchez, Analog fault identification in rf circuits using artificial neural networks and constrained parameter extraction, in 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO) (IEEE, 2018), pp. 1–3
Z. Wang, T. Oates, Imaging time-series to improve classification and imputation. arXiv preprint arXiv:1506.00327 (2015)
Y. Xiao, Y. He, A novel approach for analog fault diagnosis based on neural networks and improved kernel pca. Neurocomputing 74(7), 1102–1115 (2011)
X. Xie, X. Li, D. Bi, Q. Zhou, S. Xie, Y. Xie, Analog circuits soft fault diagnosis using Rényi’s entropy. J. Electron. Test. 31, 217–224 (2015)
C.-L. Yang, Z.-X. Chen, C.-Y. Yang, Sensor classification using convolutional neural network by encoding multivariate time series as two-dimensional colored images. Sensors 20(1), 168 (2019)
H. Yang, C. Meng, C. Wang, Data-driven feature extraction for analog circuit fault diagnosis using 1-d convolutional neural network. IEEE Access 8, 18305–18315 (2020)
Y. Yang, L. Wang, X. Nie, Y. Wang, Incipient fault diagnosis of analog circuits based on wavelet transform and improved deep convolutional neural network. IEICE Electron. Express 18(13), 20210174–20210174 (2021)
C. Zhang, D. Zha, L. Wang, M. Nan, A novel analog circuit soft fault diagnosis method based on convolutional neural network and backward difference. Symmetry 13(6), 1096 (2021)
Author information
Authors and Affiliations
Corresponding author
Ethics declarations
Conflict of interest
We declare that we do not have any commercial or associative interest that represents a conflict of interest in connection with the work submitted.
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
About this article
Cite this article
Tang, X., Zhou, X. & Liang, W. Soft Fault Diagnosis of Analog Circuits Based on Classification of GAF_RP Images With ResNet. Circuits Syst Signal Process 42, 5761–5782 (2023). https://doi.org/10.1007/s00034-023-02392-5
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00034-023-02392-5