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A Novel Incipient Fault Diagnosis Method for Analogue Circuits Based on an MLDLCN

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Abstract

Incipient faults in analogue circuits used in complex electrical systems are hard to diagnose due to weak fault features. To improve the reliability and maintainability of analogue circuits in complex electrical systems, a novel incipient soft fault diagnosis method for analogue circuits based on a multilayer dictionary learning and coding network is proposed, including feature preprocessing, linear dictionary feature encoding, and classification modules. In the first module, time–frequency analyses are performed using continuous wavelet transforms to demonstrate the spectrum maps of the fault signals, while scale-invariant feature transforms are used to enhance local features and obtain the keypoint descriptors of the time–frequency spectrum. In the second module, fault features are obtained by locally constrained linear coding (LLC) method using complete dictionaries from the keypoint descriptors acquired in the previous module, which are captured by linear combination of several adjacent atoms in the dictionary learning. To address the limitations of single-layer dictionary learning methods in complete extraction of fault features, a multilayer learning method is used to get richer fault information and improve the diagnosis accuracy. Finally, the linear output features are captured through pooling and fully connected layers. In the third module, the linear features acquired in the second module are quickly classified with simple linear classifiers. The experimental results demonstrate that the proposed method outperforms existing fault diagnosis methods. In order to verify the effectiveness of the proposed method in analogue circuit fault diagnosis, the Sallen–Key filter circuit and four-op-amp biquadratic filter circuit, which are widely used in the field, are selected as experimental circuits in this paper. Specifically, when the component fault values are offset by 20% of their nominal value, the proposed method achieves accuracies of 99.20% for the Sallen–Key bandpass filter circuit and 98.48% for the four-op-amp biquadratic filter circuit.

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Data Availability

The data supporting the findings of this study were derived from simulations in Multisim and are included within the paper (and any supplementary files).

References

  1. M. Aharon, M. Elad, A. Bruckstein, K-SVD: an algorithm for designing overcomplete dictionaries for sparse representation. IEEE Trans. Signal Process. 54, 4311–4322 (2006)

    Article  Google Scholar 

  2. J. Bandler, A. Salama, Fault-diagnosis of analog circuits. Proc. IEEE 73, 1279–1325 (1985)

    Article  Google Scholar 

  3. D. Binu, B. Kariyappa, A survey on fault diagnosis of analog circuits: taxonomy and state of the art. AEU Int. J. Electron. Commun. 73, 68–83 (2017)

    Article  Google Scholar 

  4. T. Gao, J. Yang, S. Jiang, A novel fault diagnosis method for analog circuits with noise immunity and generalization ability. Neural Comput. Appl. 33, 10537–10550 (2021). https://doi.org/10.1007/s00521-021-05810-4

    Article  Google Scholar 

  5. T. Gao, J. Yang, S. Jiang, A novel incipient fault diagnosis method for analog circuits based on GMKL-SVM and wavelet fusion features. IEEE Trans. Instrum. Meas. 70, 1–15 (2021)

    Google Scholar 

  6. K. He, X. Zhang, S. Ren, J. Sun, Deep residual learning for image recognition, in 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), vol. 20 (2016), pp. 770–778. arXiv:1512.03385

  7. W. He, Y. He, B. Li, Generative adversarial networks with comprehensive wavelet feature for fault diagnosis of analog circuits. IEEE Trans. Instrum. Meas. 69, 6640–6650 (2020)

    Article  Google Scholar 

  8. M. Holschneider, Wavelets: an analysis tool. J. Stat. Phys. 86, 1399–1400 (1997). https://doi.org/10.1007/BF02183632

    Article  MathSciNet  Google Scholar 

  9. L. Ji, C. Fu, W. Sun, Soft fault diagnosis of analog circuits based on a ResNet with circuit spectrum map. IEEE Trans. Circuits Syst. I Regul. Pap. 68, 2841–2849 (2021)

    Article  Google Scholar 

  10. F. Li, P.Y. Woo, Fault detection for linear analog IC-the method of short-circuit admittance parameters. IEEE Trans. Circuits Syst. I Fundam. Theory Appl. 49, 105–108 (2002)

    Article  Google Scholar 

  11. Y. Li, R. Zhang, Y. Guo, P. Huan, M. Zhang, Nonlinear soft fault diagnosis of analog circuits based on RCCA-SVM. IEEE Access 8, 60951–60963 (2020)

    Article  Google Scholar 

  12. Z. Liu, X. Liu, S. Xie, J. Wang, X. Zhou, A novel fault diagnosis method for analog circuits based on multi-input deep residual networks with an improved empirical wavelet transform. Appl. Sci. 12, 1675 (2022)

    Article  Google Scholar 

  13. D.G. Lowe, Distinctive image features from scale-invariant keypoints. Int. J. Comput. Vis. 60, 91–110 (2004). https://doi.org/10.1023/B:VISI.0000029664.99615.94

    Article  Google Scholar 

  14. O. Shin, Distinctive image features from scale-invariant keypoints. J. Basic Appl. Res. Int. 60, 91–110 (2004). https://doi.org/10.1023/B:VISI.0000029664.99615.94

    Article  Google Scholar 

  15. M. Sokolova, G. Lapalme, A systematic analysis of performance measures for classification tasks Inf. Process. Manag. 45, 427–437 (2009)

    Article  Google Scholar 

  16. Y. Sun, G. Shi, W. Dong, X. Xie, MADPL-net: multi-layer attention dictionary pair learning network for image classification. J. Vis. Commun. Image Represent. 90, 103728 (2023)

    Article  Google Scholar 

  17. M. Tadeusiewicz, S. Halgas, Diagnosis of a soft short and local variations of parameters occurring simultaneously in analog CMOS circuits. Microelectron. Reliab. 72, 90–97 (2017)

    Article  Google Scholar 

  18. M. Tadeusiewicz, S. Halgas, A method for local parametric fault diagnosis of a broad class of analog integrated circuits. IEEE Trans. Instrum. Meas. 67, 328–337 (2018)

    Article  Google Scholar 

  19. H. Tang, H. Liu, W. Xiao, N. Sebe, When dictionary learning meets deep learning: Deep dictionary learning and coding network for image recognition with limited data. IEEE Trans. Neural Netw. Learn. Syst. 32, 2129–2141 (2021)

    Article  MathSciNet  Google Scholar 

  20. T.H. Vu, V. Monga, Fast low-rank shared dictionary learning for image classification. IEEE Trans. Image Process. 26, 5160–5175 (2017)

    Article  MathSciNet  Google Scholar 

  21. H. Wang, G. Dong, J. Chen, X. Hu, Z. Zhu, A novel dictionary learning named deep and shared dictionary learning for fault diagnosis Mech. Syst. Signal Process. 182, 109570 (2023)

    Article  Google Scholar 

  22. J. Wang, J. Yang, K. Yu, F. Lv, T. Huang, Y. Gong, Locality-constrained linear coding for image classification, in 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, vol. 69 (2010), pp. 3360–3367

  23. Y. Xiao, L. Feng, A novel linear ridgelet network approach for analog fault diagnosis using wavelet-based fractal analysis and kernel PCA as preprocessors. Measurement 45, 297–310 (2012)

    Article  Google Scholar 

  24. C. Yang, J. Yang, Z. Liu, S. Tian, Complex field fault modeling-based optimal frequency selection in linear analog circuit fault diagnosis. IEEE Trans. Instrum. Meas. 63, 813–825 (2014)

    Article  Google Scholar 

  25. H. Yang, C. Meng, C. Wang, Data-driven feature extraction for analog circuit fault diagnosis using 1-D convolutional neural network. IEEE Access 8, 18305–18315 (2020)

    Article  Google Scholar 

  26. J. Yang, Y. Li, T. Gao, An incipient fault diagnosis method based on ATT-GCN for analogue circuits. MST 34, 045002 (2023). https://doi.org/10.1088/1361-6501/acad1e

    Article  Google Scholar 

  27. C. Zhang, Y. He, T. Yang, B. Zhang, J. Wu, An analog circuit fault diagnosis approach based on improved wavelet transform and MKELM. Circuits Syst. Signal Process. 41, 1255–1286 (2022). https://doi.org/10.1007/s00034-021-01842-2

    Article  Google Scholar 

  28. C. Zhang, Y. He, L. Yuan, W. He, S. Xiang, Z. Li, A novel approach for diagnosis of analog circuit fault by using GMKL-SVM and PSO. J. Electron. Test. 32, 531–540 (2016)

    Article  Google Scholar 

  29. C. Zhang, Y. He, L. Yuan, S. Xiang, Analog circuit incipient fault diagnosis method using DBN based features extraction. IEEE Access 6, 23053–23064 (2018)

    Article  Google Scholar 

  30. Z. Zhang, W. Jiang, J. Qin, L. Zhang, F. Li, M. Zhang, S. Yan, Jointly learning structured analysis discriminative dictionary and analysis multiclass classifier. IEEE Trans. Neural Netw. Learn. Syst. 29, 3798–3814 (2018)

    Article  MathSciNet  Google Scholar 

  31. R. Zunino, J. Xiong, S. Tian, C. Yang, Fault diagnosis for analog circuits by using EEMD, relative entropy, and ELM. Comput. Intell. Neurosci. (2016). https://doi.org/10.1155/2016/7657054

    Article  Google Scholar 

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Acknowledgements

This paper is supported by the National Natural Science Foundation of China (No. 62171157).

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Correspondence to Tianyu Gao.

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Liu, X., Yang, H., Gao, T. et al. A Novel Incipient Fault Diagnosis Method for Analogue Circuits Based on an MLDLCN. Circuits Syst Signal Process 43, 684–710 (2024). https://doi.org/10.1007/s00034-023-02524-x

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