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Signature analysis and defect detection in layered manufacturing of ceramic sensors and actuators

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Abstract.

This paper presents the concept of a process signature for the use of online signature analysis and defect detection in the layered manufacturing (LM) of ceramic sensors and actuators. To achieve the high quality of parts built by the fused deposition of ceramics (FDC), an online process-monitoring system is implemented to detect the processing defects. Using a process signature extracted from the image of a layer captured by the monitoring system, an ideal image is created that is then compared to the original image to detect and identify the defects. Some results of signature analysis and defect detection for single-material and multi-material parts are also presented.

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Author information

Authors and Affiliations

  1. Siemens Corporate Research, Inc., NJ 08540, Princeton, USA

    Tong Fang

  2. Department of Industrial Engineering, Rutgers University, NJ 08855, Piscataway, USA

    Mohsen A. Jafari

  3. Center of Ceramics, Rutgers University, NJ 08855, Piscataway, USA

    Stephen C. Danforth & Ahmad Safari

Authors
  1. Tong Fang
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  2. Mohsen A. Jafari
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  3. Stephen C. Danforth
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  4. Ahmad Safari
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Additional information

Received: 22 July 1999, Accepted: 21 October 2001, Published online: 29 October 2003

Correspondence to: Mohsen A. Jafari

This work was supported by the Office of Naval Research under grant # N-0014-96-1-1175. Ref. US Patent # S-5738817, April 14, 1998.

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Fang, T., Jafari, M.A., Danforth, S.C. et al. Signature analysis and defect detection in layered manufacturing of ceramic sensors and actuators. Machine Vision and Applications 15, 63–75 (2003). https://doi.org/10.1007/s00138-002-0074-1

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  • DOI: https://doi.org/10.1007/s00138-002-0074-1

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