Abstract
We develop an user-interface package mTEXO in the Maplet application for testing exponential upper and/or lower outliers. The distributions of some well-known test statistics for exponential outliers in the literature can be easily evaluated using mTEXO, saving considerable computational time performing numerical integrations and combinatorial algebra necessary in the traditional approach.
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Funding was provided by Ministry of Science and Technology, Taiwan (Grant No. 104-2118-M-032-001-MY2).
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Lin, CT., Lee, YC. & Balakrishnan, N. Package mTEXO for testing the presence of outliers in exponential samples. Comput Stat 34, 803–818 (2019). https://doi.org/10.1007/s00180-018-0843-6
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DOI: https://doi.org/10.1007/s00180-018-0843-6