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TFTSVM: near color recognition of polishing red lead via SVM based on threshold and feature transform

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Abstract

With the extensive application of machine vision in the manufacturing industry, target region recognition in complex industrial scenes is becoming a vital research territory. In the automatic polishing of molds, polishing red lead, as an auxiliary tool for polishing positioning, can intuitively determine the areas to be polished. Its bright color information are very suitable for vision-based recognition. Due to the interference of the near color in the polishing environment, the traditional color recognition method has the appearance of over-segmentation. In this paper, we propose a novel near-color recognition method via SVM based on threshold and feature transform (TFTSVM) to improve the identification accuracy of polishing red lead. Specifically, this method adopts a threshold-based color recognition algorithm to extract two kinds of color features of red lead color and its near color in HSV color space and skillfully finds it is distinguishable in three dimensions. To reduce the computational complexity, a machine learning segmentation model is constructed, which realizes dimension reduction by integrating the feature transformation method of sample transformation and projection transformation to achieve the best segmentation effect. Experimental results on self-established dataset demonstrate that the proposed method has an excellent identification effect on the red lead area in the field polishing environment and also shows good robustness under the condition that there are reflections on the mold surface. It meets the requirements of mechanical arm polishing and improves the safety and reliability of automatic polishing. In addition, we also compare different machine learning algorithms and advanced studies to verify the correctness of the algorithm. This method also provides a reference for realizing near-color recognition in complex industrial environments.

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Acknowledgements

This work was supported by the Sichuan Science and Technology Program (2021YFG0194).

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ZL contributed to Writing—Review & Editing, Project administration, Funding acquisition. XL contributed to Methodology, Validation, Writing—Original Draft. YH contributed to Resources, Writing—Review & Editing, Supervision.

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Correspondence to Zhengzhi Luo.

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Liang, X., Luo, Z. & Han, Y. TFTSVM: near color recognition of polishing red lead via SVM based on threshold and feature transform. Vis Comput 40, 717–730 (2024). https://doi.org/10.1007/s00371-023-02811-3

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