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An 11-bit successive approximation analog-to-digital converter based on a combined capacitor-resistor network

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Summary

Within this work an 11-bit integrated Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC) based on a combined capacitor and resistor network is presented. Utilizing this approach, the chip area is reduced by the factor of 24 compared to conventional solutions without any interpolation and it occupies only 0.3 mm2. Furthermore, the equivalent capacitance is decreased by connecting two capacitors in series, whereby the matching and the power consumption are improved. The measured Differential Non-Linearity (DNL) and the Integral Non-Linearity (INL) are below 0.3 and 0.5 LSBs, respectively. The calculated Effective Number Of Bits (ENOB) accounts to 10.72 bits. The chip is produced in 0.6 µm CMOS technology.

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References

  • Alpman, E., Lakdawala, H., Carley, L. R., Soumyanath, K. (2009): A 1.1 V 50 mW 2.5 GS/s 7b Time-Interleaved C-2C SAR ADC in 45 nm LP Digital CMOS. IEEE ISSCC Dig. Tech. Papers: 76–77

  • Baker, R. J. (2008): CMOS Circuit Design, Layout, and Simulation. 2nd ed. New York: Wiley-Interscience

    Google Scholar 

  • Baschirotto, A. (2009): SAR ADCs. ISSCC 2009 Tutorial

  • Craninckx, J., Van der Plas, G. (2007): A 65 fJ/Conversion-Step 0-to-50 MS/s 0-to-0.7 mW 9b Charge-Sharing SAR ADC in 90 nm Digital CMOS. IEEE ISSCC Dig. Tech. Papers: 246–247

  • Davidovic, M., Nemecek, A., Zach, G., Zimmermann, H. (2008): A 20 MS/s 11-bit Digital-to-Analog Converter Using a Combined Capacitor and Resistor Network. In: Proc. 26th IEEE Norchip Conf., 85–88

  • Giannini, V., Nuzzo, P., Chironi, V., Baschirotto, A., Van der Plas, G., Craninckx, J. (2008): An 820 µW 9b 40 MS/s Noise-Tolerant Dynamic-SAR ADC in 90 nm Digital CMOS. IEEE ISSCC Dig. Tech. Papers: 238–239

  • Hesener, M., Eichler, T., Hanneberg, A., Herbison, D., Kuttner, F., Wenske. H. (2008): A 14b 40 MS/s Redundant SAR ADC with 480 MHz Clock in 0.13µm CMOS. IEEE ISSCC Dig. Tech. Papers: 248–249

  • Jun, C., Feng, R., Mei-hua, X. (2007): IC Design of 2 Ms/s 10-bit SAR ADC with Low Power. IEEE HDP 07: 1–3

    Google Scholar 

  • Kester, W. (2006): ADC Input Noise: The Good, The Bad, and The Ugly. Is No Noise Good Noise? Analog Devices

  • Kobayashi, T., Nogami, K., Shirotori, T., Fujimoto, Y. (1993): A current controlled latch sense amplifier and a static power-saving input buffer for low-power architecture. IEEE Journal of Solid-State Circuits, 28: 523–527

    Article  Google Scholar 

  • Kuttner, F. (2002): A 1.2 V 10b 20 M Sample/s Non-Binary Successive Approximation ADC in 0.13 µm CMOS. IEEE ISSCC Dig. Tech. Papers, 1: 176–177

    Google Scholar 

  • Lin, C.-S., Liu, B.-D. (2003): A new successive approximation architecture for low-power low-cost CMOS A/D converter. IEEE Journal of Solid-State Circuits, 38: 54–62

    Article  Google Scholar 

  • McCreary, J. L., Gray, P. R. (1975): All-MOS charge redistribution analog-to-digital conversion techniques – Part I. IEEE Journal of Solid-State Circuits, SC-10 (6), 371–379

    Google Scholar 

  • Promitzer, G. (2001): 12-bit low-power fully differential switched capacitor noncalibrating successive approximation ADC with 1 MS/s. IEEE Journal of Solid-State Circuits, 36 (7): 1138–1143

    Article  Google Scholar 

  • Ting, H.-W., Liu, B.-D., Chang, S.-J. (2006): Histogram Based Testing Strategy for ADC. IEEE 15th Asian Test Symp: 51–54

  • Van de Plassche, R. (2003): CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters. 2nd ed. Dordrecht: Kluwer Academic Publishers

    MATH  Google Scholar 

  • Van Elzakker, M., van Tuijl, E., Geraedts, P., Schinkel, D., Klumperink, E., Nauta, B. (2008): A 1.9 µW 4.4 fJ/Conversion-step 10b 1 MS/s Charge-Redistribution ADC. IEEE ISSCC Dig. Tech. Papers: 243–244

  • Wagdy, M. F., Awad, S. S. (1991): Determining ADC effective number of bits via histogram testing. IEEE Transactions on Instrumentation and Measurement, 40: 770–772

    Article  Google Scholar 

  • Wicht, B., Nirschl, T., Schmitt-Landsiedel, D. (2004): Yield and Speed Optimization of a Latch-Type Voltage Sense Amplifier. IEEE Journal of Solid-State Circuits, 39 (7): 1148–1158

    Article  Google Scholar 

  • Zach, G., Davidovic, M., Zimmermann, H. (2009): Extraneous-Light Resistant Multipixel Range Sensor Based on a Low-Power Correlating Pixel-Circuit. IEEE ESSCIRC, 2009

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Davidovic, M., Zach, G. & Zimmermann, H. An 11-bit successive approximation analog-to-digital converter based on a combined capacitor-resistor network. Elektrotech. Inftech. 127, 98–102 (2010). https://doi.org/10.1007/s00502-010-0704-7

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  • DOI: https://doi.org/10.1007/s00502-010-0704-7

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