Summary
Due to the increasing complexity of embedded systems, trends towards highly integrated and distributed solutions as well as the advent of multi-processor architectures the tasks of debugging and testing become more and more important. Since existing technologies and tools entirely neglect the distributed character of many applications a radically new patent-registered concept was developed at the University of Applied Sciences Technikum Wien which is notably suitable to be integrated in system-on-chips. This work presents the new concept as well as results from a prototype implementation which is compared to traditional approaches for test and debugging of embedded systems.
Zusammenfassung
Bedingt durch die zunehmende Komplexität von eingebetteten Systemen, Trends zu Hochintegration, Vernetzung sowie den Einsatz von Multi-Prozessor-Architekturen kommt der Thematik von Test und Debugging immer größere Bedeutung zu. Nachdem existierende Technologien und Werkzeuge den Charakter vernetzter Systeme kaum berücksichtigen, wurde am Institut für Embedded Systems der Fachhochschule Technikum Wien ein radikal neues, mittlerweile patentiertes Konzept entwickelt, das sich besonders zur Integration in System-on-Chips eignet. Das Konzept wird im Rahmen dieses Beitrags vorgestellt, Ergebnisse einer Prototypenimplementierung werden präsentiert und mit traditionellen Ansätzen für Test und Debugging in eingebetteten Systemen verglichen.
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Höller, R., Rössler, P., Puhm, A. et al. Eine neuartige Lösung für Test und Debugging in vernetzten eingebetteten Systemen. Elektrotech. Inftech. 127, 91–97 (2010). https://doi.org/10.1007/s00502-010-0727-0
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DOI: https://doi.org/10.1007/s00502-010-0727-0