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Self-embedding fragile watermarking scheme to restoration of a tampered image using AMBTC

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Abstract

The problem of digital forgeries has become more and more serious in various fields like entertainment, digital forensics, and journalism. This paper proposes a self-embedding watermarking scheme for the restoration of an image after tampering by digital forgery. In this study, an absolute moment block truncation coding image was used as a watermark, in which the image was a compressed version of the original cover image and contained the content features of the cover image. Therefore, it was perfectly possible to perform self-embedding. The watermark was embedded using the LSB and 2LSB for the pixels of the cover image. This procedure made it possible to recover the original watermarked image from a tampered watermarked image. Furthermore, there was no problem in reconstructing it when the rate of tampering was more than 80%. In addition, we verified our proposed self-embedding scheme through an experiment. As a result of the experiment, the recovered image showed good perceptual quality compared to that of the previous scheme.

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Acknowledgements

This research was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (2015R1D1A1A01059253). This work was supported under the framework of the international cooperation program managed by the National Research Foundation of Korea (2016K2A9A2A05005255).

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Authors and Affiliations

  1. Department of Computer Science and Engineering, Sejong University, Seoul, Republic of Korea

    Cheonshik Kim & Dongkyoo Shin

  2. Department of Computer Science and Information Engineering, National Dong Hwa University, Hualien, Taiwan

    Ching-Nung Yang

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  1. Cheonshik Kim
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  2. Dongkyoo Shin
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  3. Ching-Nung Yang
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Correspondence to Cheonshik Kim or Dongkyoo Shin.

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Kim, C., Shin, D. & Yang, CN. Self-embedding fragile watermarking scheme to restoration of a tampered image using AMBTC. Pers Ubiquit Comput 22, 11–22 (2018). https://doi.org/10.1007/s00779-017-1061-x

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  • DOI: https://doi.org/10.1007/s00779-017-1061-x

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