Skip to main content
Log in

From testing to anti-product development

  • Special section on advances in test automation – the evolution of TTCN-3
  • Published:
International Journal on Software Tools for Technology Transfer Aims and scope Submit manuscript

Abstract

The requirements for testing in large software projects drastically changed in recent years. The reasons for this mainly come from evolving development processes, demanding early stabilisations of complete software loads, early handover to subsequent steps, high software release quality, and in particular flexible adaptations to changing roadmaps. This study is an experience report from industrial testing in the field of telecommunications software and based on a speech given by the author at the Testing and Test Control Notation version 3 (TTCN-3) User Conference in Berlin 2006. It advocates to consider modern testing rather as the development of an anti-product that is to be developed in parallel to the product. This anti-product is itself a complex software system. Following this approach has a significant impact on the testing in these large software projects mentioned and leads to a number of consequences for the development of test systems and the structure of test teams. In this study, the role and virtues of TTCN-3 as programming language for anti-products as well as for defining the test system structure are investigated. Dealing with large embedded software systems that have several concurrent parts and additionally obey soft real-time requirements, similar constraints also hold for the test system. The virtues of parallel testing/software development life cycles as it becomes mandatory in following modern development processes are presented, and it is shown how TTCN-3 turned out in our experience to be a language particularly well suited for this purpose because of its advanced structured programming concepts derived from strong typing, template concepts and parametrizations of templates.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. Beck K. (2005). Extreme programming explained. Embrace change. Addison-Wesley Longman, Amsterdam

    Google Scholar 

  2. Bundesinnenministerium (German Ministry of the Interior) KBSt—Federal Government Co-ordination and Advisory Agency Official V-Model home page http://www.v-modell-xt.de/

  3. Dröschel W., Heuser W. and Midderhoff R. (1998). (Hrsg.), Inkrementelle und objektorientierte Vorgehensweisen mit dem V-Modell 97. Oldenbourg, München. ISBN 3-486-24276-8

    Google Scholar 

  4. ETSI ES 201 873-1 V3.2.1 Methods for testing and specification (MTS); the testing and test control notation version 3; Part 1: TTCN-3 core language

  5. ETSI ES 201 873-5 V3.2.1 Methods for Testing and Specification (MTS); the testing and test control notation version 3; Part 5: TTCN-3 runtime interface (TRI)

  6. ETSI ES 201 873-6 V3.2.1 Methods for testing and specification (MTS); the testing and test control notation version 3; Part 6: TTCN-3 control interface (TCI)

  7. ISO/IEC 9646-3:1998 Information technology—open systems interconnection—conformance testing methodology and framework—part 3: the tree and tabular combined notation (TTCN)

  8. Larman, C.: Agile and iterative development: a manager’s guide (Agile Software Development Series). Addison-Wesley Longman, Amsterdam

  9. Srinivasan, R.: XDR: external data representation standard. RFC 1832, Sun Microsystems, Inc. August 1995

  10. Willcock, C., Deiß  T., Tobies, S., Schulz, S.: An Introduction to TTCN-3. Wiley, New York. ISBN-10:0-470-01224-2

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Markus Warken.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Warken, M. From testing to anti-product development. Int J Softw Tools Technol Transf 10, 297–307 (2008). https://doi.org/10.1007/s10009-008-0074-1

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10009-008-0074-1

Keywords

Navigation