Abstract
Negative selection algorithm is the core algorithm of artificial immune system. It only uses the self for training and generates detectors to detect abnormalities. Holes are feature space areas that the detector fails to cover, it is the root cause of the performance degradation of the negative selection algorithm. The conventional method generates a large number of detectors randomly to repair the holes, which is time-consuming and not effective. To alleviate the problem, we propose a V-Detector-KN algorithm in this paper. V-Detector is the abbreviation of the real-valued negative selection algorithm with Variable-sized Detectors, KN represents Known Nonself. The V-Detector-KN algorithm uses the known nonself as the candidate detector to further generate the detector based on the V-Detector randomly generated detector, so as to realize the repair of holes. Compared with the conventional method to randomly generate detectors to repair holes, our proposed V-Detector-KN method uses known nonself to repair holes, reducing the randomness and blindness of hole repair. Theoretical analysis shows that the detection rate of our algorithm is not lower than that of the conventional V-Detector algorithm. The results of experiment comparing with other 6 algorithms on 7 UCI data sets show the superiority of our proposed algorithm.
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Acknowledgements
This work has been supported by the National Key Research and Development Program of China (Grant No.2020YFB1805400), National Natural Science Foundation of China (Grant No. U19A2068, No.U1736212, No.62032002).
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Li, Z., Li, T. Using known nonself samples to improve negative selection algorithm. Appl Intell 52, 482–500 (2022). https://doi.org/10.1007/s10489-021-02323-4
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DOI: https://doi.org/10.1007/s10489-021-02323-4