Abstract
The Space Fault Tree (SFT) is a theoretical and technical framework proposed by the author in 2012. The SFT measures the reliability with fault probability, and analyzes the relationship between system reliability and influencing factors. The characteristic function (CF) of SFT is constructed by the relationship between the component fault probability and the influencing factors, and is the basis of the SFT. The system fault data is different from the general monitoring data, which has large discreteness, randomness and fuzziness, that is, uncertainty. The existing characteristic function is a continuous function with finite discontinuities. The function can be considered as a kernel function of the fault data, but it is difficult to express the uncertainty of fault data. To this end, using cloud model (CM) to transform the characteristic function, so that it has the ability to express the uncertainty of data, called the cloudization characteristic function (CCF). The cloudization SFT (CLSFT) is constructed by using the CCF, and enables the relevant theory and methods of SFT to express the data uncertainty, thus the expression of the fault data characteristics and rules are more accurate. Firstly, the construction process and rationality analysis of CLSFT are given. Secondly, the concepts of SFT are reconstructed by cloud model. Use these definitions and methods to analyze the fault data of a simple electrical component. The relationship is studied between the component fault probability and the using time and using temperature. The results reflect the discreteness, randomness and fuzziness of the fault data to a large extent. In summary, the paper provides the reference for analyzing and controlling the uncertainty of the fault data and reliability in practical application.
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Abbreviations
- Ex :
-
Digital features of cloud, expectation
- En :
-
Digital features of cloud, entropy
- He :
-
Digital features of cloud, hyper entropy
- C(ex,en,he):
-
Cloud model
- \(\mu _\mathrm{q}\) :
-
Certainty degree of concept
- \(P_i^d (x)\) :
-
Characteristic function of basic event occurrence probability
- i :
-
The ith component
- \(d_{k}\) :
-
Influencing factor, \(d_k \in \{x_1 ,x_2 ,\ldots x_n \}\)
- n :
-
Number of influencing factors
- \(P_i (x_1 ,x_2 ,\ldots x_n )\) :
-
Basic event occurrence probability distribution
- \(x_k \) :
-
Specific values of factor \(d_k \)
- \(P_T (x_1 ,x_2 ,\ldots x_n )\) :
-
Top event(system) occurrence probability distribution
- \(P_i^{d_k } \backslash P_T^{d_k } \) :
-
Basic event \(\backslash \) top event(system) occurrence probability distribution trend
- \(I_g (i)\) :
-
Probability importance distribution
- \(I_g^c (i)\) :
-
Criticality importance distribution
- \(FI_i (x_1 ,x_2 ,\ldots x_n )\backslash \) :
-
Component \(\backslash \)system factor
- \(FI_T (x_1 ,x_2 ,\ldots x_n )\) :
-
distribution \(\backslash \) factor joint importance distribution
- \(ZI_g (i)\) :
-
Component domain probability importance
- \(ZI_g^c (i)\) :
-
Component domain criticality importance
- \(P_{b}\) :
-
Domain boundary of component \(\backslash \) system
- \(K_{j}(j\) = 1,2,..., r):
-
The jth set in r minimal cut set of fault tree
- \(E_{i}/ E_{ii}\) :
-
ith/iith basic event in \(K_{j}\)\(Ex_k , He_k \) and \(En_k \): characteristic parameters of the cloud model obtained from reverse cloud model generator considering the influence of kth influencing factor on reliability data
- subscript k :
-
Corresponding parameters of the kth factors \(P_{T\rightarrow d_k }^{Ex} (x_1 ,x_2 ,\ldots x_n ), P_{T\rightarrow d_k }^{En} (x_1 ,x_2 ,\ldots x_n ), P_{T\rightarrow d_k }^{He} (x_1 ,x_2 ,\ldots x_n )\) Three parameters for the uncertainty of system reliability data considering \(d_k \)
- M and c :
-
The total number of cloud droplets
- Q :
-
Threshold
- \(\lambda _{\max } \) and \(\lambda _{\min } \) :
-
The maximum and minimum values in the differential fault probability distribution, respectively
- \(\lambda \) :
-
Absolute value of deviation from 0 \(m_{En} , \quad m_{Ex} , \quad m_{He} \) Number of cloud droplets not in the \([-\lambda ,\lambda ]\). \(\delta _f , \quad \delta _d \) and \(\delta _r \) Fuzziness, discreteness and randomness of reliability data respectively
- H:
-
Using humidity
- C :
-
Using temperature
- T :
-
Instance system
- \(X_{1\sim 5}\) :
-
The five components in the instance system
- \(C_{1}^{c}\) and \(C_{1}^{h}\) :
-
The cloud model under the influence of the using temperature c and using humidity h on the reliability of \(X_{1}\)
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Acknowledgements
The author wishes to thank all his friends for their valuable critics, comments and assistances on this paper. This study was partially supported by the grants (Grant Nos. 51704141, 51474121, 51674127) from the Natural Science Foundation of China.
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Li, SS., Cui, TJ. & Liu, J. Study on the construction and application of Cloudization Space Fault Tree. Cluster Comput 22 (Suppl 3), 5613–5633 (2019). https://doi.org/10.1007/s10586-017-1398-y
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DOI: https://doi.org/10.1007/s10586-017-1398-y