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On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression

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Abstract

We examine the use of exponential-Golomb codes and subexponential codes can be used for the compression of scan test data in core-based system-on-a-chip (SOC) designs. These codes are well-known in the data compression domain but their application to SOC testing has not been explored before. We show that these codes often provide slighly higher compression than alternative methods that have been proposed recently.

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Correspondence to Lei Li or Krishnendu Chakrabarty.

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Li, L., Chakrabarty, K. On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression. J Electron Test 20, 667–670 (2004). https://doi.org/10.1007/s10677-004-4254-0

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  • DOI: https://doi.org/10.1007/s10677-004-4254-0

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