Abstract
We examine the use of exponential-Golomb codes and subexponential codes can be used for the compression of scan test data in core-based system-on-a-chip (SOC) designs. These codes are well-known in the data compression domain but their application to SOC testing has not been explored before. We show that these codes often provide slighly higher compression than alternative methods that have been proposed recently.
Similar content being viewed by others
Author information
Authors and Affiliations
Corresponding authors
Rights and permissions
About this article
Cite this article
Li, L., Chakrabarty, K. On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression. J Electron Test 20, 667–670 (2004). https://doi.org/10.1007/s10677-004-4254-0
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/s10677-004-4254-0