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A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog Testing

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Abstract

This paper presents a 0.35-μm CMOS on-chip spectrum analyzer based on switched-capacitor (SC) techniques. The prototype device utilizes a 3-V supply and basically includes an SC sine-wave generator, a fourth-order high-selectivity SC filter, and a programmable gain amplifier followed by an 8-b analog-to-digital converter. A non-uniform sampling scheme, which adds one degree of freedom in determining the frequency response parameters of SC circuits, helps to obtain high programmability resolution without modifying any capacitor value. As a result, capacitor spread and total capacitor area are reduced as compared to traditional SC solutions and, hence, test area overhead is minimized. Experimental results demonstrate the effectiveness of the proposed approach to perform frequency response and total harmonic distortion measurements for frequencies up to 1 MHz.

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Authors and Affiliations

  1. Department of Electronic and Electrical Engineering, University of Extremadura, 06071, Badajoz, Spain

    M. A. Domínguez, J. L. Ausín & J. F. Duque-Carrillo

  2. Department of Electronics, University of Pavia, Via Ferrata 1, I-27100, Pavia, Italy

    G. Torelli

Authors
  1. M. A. Domínguez
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  2. J. L. Ausín
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  3. J. F. Duque-Carrillo
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  4. G. Torelli
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Correspondence to J. L. Ausín.

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Editor: A. Richardson

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Domínguez, M.A., Ausín, J.L., Duque-Carrillo, J.F. et al. A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog Testing. J Electron Test 22, 437–448 (2006). https://doi.org/10.1007/s10836-006-9503-9

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  • DOI: https://doi.org/10.1007/s10836-006-9503-9

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