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Minimal March Tests for Detection of Dynamic Faults in Random Access Memories

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Abstract

The class of dynamic faults has been recently shown to be an important class of faults for the new technologies of Random Access Memories (RAM) with significant impact on defect-per-million (DPM) levels. Very little research has been done in the design of memory test algorithms targeting dynamic faults. Two March test algorithms of complexity 11N and 22N, N is the number of memory cells, for subclasses of two-operation single-cell and two-cell dynamic faults, respectively, were proposed recently [Benso et al., Proc., ITC 2005] improving the length of the corresponding tests proposed earlier [Hamdioui et al., Proc. of IEEE VLSI Test Symposium, pp. 395–400, 2002]. Also, a March test of length 100N was proposed [Benso et al., Proc. ETS 2005, Tallinn, pp. 122–127, 2005] for detection of two-cell dynamic faults with two fault-sensitizing operations both applied on the victim or aggressor cells. In this paper, for the first time, March test algorithms of minimum length are proposed for two-operation single-cell and two-cell dynamic faults. In particular, the previously known March test algorithm of length 100N for detection of two-operation two-cell dynamic faults is improved by 30N.

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Authors and Affiliations

  1. Virage Logic, 15/1 Khorenatsi str., Yerevan, 375010, Armenia

    G. Harutunyan & V. A. Vardanian

  2. Virage Logic, 47100 Bayside Parkway, Fremont, CA, 94538, USA

    Y. Zorian

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  1. G. Harutunyan
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  2. V. A. Vardanian
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  3. Y. Zorian
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Correspondence to V. A. Vardanian.

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Editor: J. P. Hayes

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Harutunyan, G., Vardanian, V.A. & Zorian, Y. Minimal March Tests for Detection of Dynamic Faults in Random Access Memories. J Electron Test 23, 55–74 (2007). https://doi.org/10.1007/s10836-006-9504-8

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  • DOI: https://doi.org/10.1007/s10836-006-9504-8

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