Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Mir, S., Cheng, T. & Richardson, A. Guest Editorial. J Electron Test 22, 311 (2006). https://doi.org/10.1007/s10836-006-9946-z
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10836-006-9946-z