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RF Testing on a Mixed Signal Tester

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Abstract

In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test equipment (ATE) will be used. In this paper, a more universal test structure utilizing RF building blocks is proposed. A global positioning system (GPS) device is used as an example to illustrate how to develop the RF test plan with this usage. The test plan developed includes fast, cost-effective and dedicated circuitry.

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References

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Authors and Affiliations

  1. RF Test Development Group, IBM Microelectronics, Essex Junction, VT, 05452, USA

    Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat & Mustapha Slamani

Authors
  1. Dana Brown
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  2. John Ferrario
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  3. Randy Wolf
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  4. Jing Li
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  5. Jayendra Bhagat
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  6. Mustapha Slamani
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Corresponding author

Correspondence to Jing Li.

Additional information

Editor: S. Mir

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Brown, D., Ferrario, J., Wolf, R. et al. RF Testing on a Mixed Signal Tester. J Electron Test 23, 85–94 (2007). https://doi.org/10.1007/s10836-006-9947-y

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  • DOI: https://doi.org/10.1007/s10836-006-9947-y

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