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IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection

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Abstract

A novel oscillation ring (OR) test scheme and architecture for testing interconnects in SOC is proposed and demonstrated. In addition to stuck-at and open faults, this scheme can also detect delay faults and crosstalk glitches, which are otherwise very difficult to be tested under the traditional test schemes. IEEE Std. 1500 wrapper cells are modified to accommodate the test scheme. An efficient algorithm is proposed to construct ORs for SOC based on a graph model. Experimental results on MCNC benchmark circuits have been included to show the effectiveness of the algorithm. In all experiments, the scheme achieves 100% fault coverage with a small number of tests.

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Authors and Affiliations

  1. Department of Computer Science and Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan, Republic of China

    Katherine Shu-Min Li

  2. Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan, People’s Republic of China

    Chung-Len Lee

  3. Department of Electronic Control, National Chiao Tung University, Hsinchu, Taiwan, People’s Republic of China

    Chauchin Su

  4. Department of Electrical Engineering, National Central University, Chungli, Taiwan, People’s Republic of China

    Jwu E Chen

Authors
  1. Katherine Shu-Min Li
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  2. Chung-Len Lee
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  3. Chauchin Su
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  4. Jwu E Chen
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Correspondence to Katherine Shu-Min Li.

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Editor: M. Breuer

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Li, K.SM., Lee, CL., Su, C. et al. IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection. J Electron Test 23, 341–355 (2007). https://doi.org/10.1007/s10836-007-0759-5

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  • DOI: https://doi.org/10.1007/s10836-007-0759-5

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