Skip to main content
Log in

Methods of Testing Discrete Semiconductors in the 1149.4 Environment

  • Published:
Journal of Electronic Testing Aims and scope Submit manuscript

Abstract

This paper describes measurement methods for testing discrete semiconductors in the environment defined by the IEEE 1149.4 standard for a mixed-signal bus. First, the paper introduces and illustrates measurement procedures for obtaining such essential electrical parameters of diodes and transistors as can be used for testing and identification. Then, the procedures are carried out and the achieved measurement results presented. To demonstrate the usability of the measurement procedures, the paper then presents test methods and measurement results for discrete component blocks. The results indicate that testing and measuring some of the electrical parameters of discrete semiconductors is possible in the 1149.4 environment. These parameters allow the determination of whether the component under test is working properly or not. Our tests only covered the semiconductors’ DC features, disregarding their AC features. Also discussed are limitations of the 1149.4 environment in discrete semiconductor testing.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7
Fig. 8
Fig. 9
Fig. 10

Similar content being viewed by others

References

  1. Dejanovic S, Persson U, Kuttainen S, Westerfur L (2005) Measurement of electrical parameters using mixed-signal test bus, IEEE Std. 1149.4. Measurement 37:260–277

    Article  Google Scholar 

  2. Duzevik I (2002) Preliminary results of passive component measurement methods using an IEEE 1149.4 compliant device. Paper presented at the 1st IEEE International Board Test Workshop, Baltimore, 10–11 October 2002

  3. Gizopoulus D (2006) In: Parker KP (ed) Advances in electronic testing: challenges and methodoligies. Springer, Berlin Heidelberg New York, pp 371–406

    Google Scholar 

  4. IEEE Std 1149.4-1999 (2000) Standard for a mixed-signal test bus. IEEE, Piscataway

  5. Hird K, Parker KP, Follis B (2002) Test coverage: What does it mean when a board test passes. In: International test conference. IEEE, Piscataway, pp 1066–1074

  6. Jeffrey C, Cutajar R, Prosser S, Lickess M, Richardson A, Riches S (2005) The integration of on-line monitoring and reconfiguration functions using IEEE1149.4 into a safety critical automotive electronic control unit. In: Design, automation and test in Europe, proceedings, vol. 3. ACM, New York, pp 153–158

    Article  MATH  Google Scholar 

  7. Kac U, Novak F, Azais F, Nouet P, Renovell M (2003) Extending IEEE Std. 1149.4 analog boundary module to enhance mixed-signal test. IEEE Des Test Comput 20(2):32–39

    Article  Google Scholar 

  8. Kac U, Novak F, Macek S, Zarnik MS (2000) Alternative test methods using IEEE 1149.4. In: Design, automation and test in Europe conference and exhibition 2000. Proceedings. March 27–30. ACM, New York, pp 463–467

  9. Loveday GC (1995) Electronic testing and fault diagnosis, 3rd edn. Pearson, London

    Google Scholar 

  10. Parker KP, McDermid JE, Oresjo S (1993) Structure and metrology for an analog testability bus. In: International test conference. IEEE, Piscataway, pp 309–322

  11. Saikkonen T, Voutilainen J, Moilanen M (2003) Some methods to calculate the values of passive components from the measurements made with an 1149.4 compliant device. Paper presented at the 2nd IEEE International Board Test Workshop, 2–3 October 2003

  12. Saikkonen T, Voutilainen J, Moilanen M (2004) Calculating the values of passive components in 1149.4 environment. Paper presented at the 3rd IEEE International Board Test Workshop, Fort Collins, 12–14 September 2004

  13. da Silva JM, Laramjeira LC, Matos JS (1999) A method for testing analog clusters using IEEE P1149.4. In: Proceedings of International Mixed Signal Test Workshop. IEEE, Piscataway, pp 125–130

  14. Sunter S, Filliter K, Woo J, McHugh P (2001) A general purpose 1149.4 IC with HF analog test capabilities. In: Proceedings of IEEE International Test Conference. IEEE, Piscataway, pp 38–45

  15. Suparjo B, Ley A, Cron A, Ehrenberg H (2006) Analog boundary-scan description language (ABSDL) for mixed-signal board test. In: Proceedings of IEEE International Test Conference. IEEE, Piscataway, pp 1–9

  16. Syri P, Häkkinen J, Moilanen M (2005) IEEE 1149.4 compatible ABMs for basic RF measurements. In: Proceedings of the design, automation and test in Europe conference and exhibition (DATE’05). ACM, New York, pp 172–173

  17. Voutilainen J, Moilanen M (2005) Embedded characterization technique for BGA solder joint wear-out with 1149.4 mixed-signal test bus architecture. In: IEEE European Test Symposium, Estonia, 22–25 May 2005

Download references

Acknowledgments

The authors wish to thank National Semiconductor Corp. for providing us with the STA400s and JTAG for providing the boundary-scan controller. The authors also wish to extend their warmest thanks to Teuvo Saikkonen for helping out with the software. The Technology Development Centre of Finland, Nokia and Elektrobit Group are acknowledged for funding the Embedded Testing of Mixed-Signal Devices Project, under which this work was carried out. Also Polar Electro is thankfully acknowledged.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Jari Hannu.

Additional information

Responsible Editor: M. Lubaszewski

Rights and permissions

Reprints and permissions

About this article

Cite this article

Hannu, J., Moilanen, M. Methods of Testing Discrete Semiconductors in the 1149.4 Environment. J Electron Test 23, 581–592 (2007). https://doi.org/10.1007/s10836-007-5007-5

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10836-007-5007-5

Keywords

Navigation