Skip to main content
Springer Nature Link
Log in

A Design-Based Structural Test Method for a Switched-Resistor DAC

  • Published:
Journal of Electronic Testing Aims and scope Submit manuscript

Abstract

In this paper, a design-based structural testing method is presented to enable a fast, low cost test for a switched-resistor digital-to-analogue converter (DAC). A 24-bit stereo DAC is used to demonstrate this. After schematic-level simulations and experimental verification, it is found that the dynamic parameter THD can be predicted by the static test. Practical production wafer test and final test results evaluate this structural test method by comparing it with the traditional THD test method. In this paper the simulation results, the relevant measurement results, and the testing results are discussed. Finally, the application recommendations are given.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7
Fig. 8
Fig. 9
Fig. 10
Fig. 11
Fig. 12
Fig. 13
Fig. 14
Fig. 15

Similar content being viewed by others

References

  1. Csizmadia N, Janssen AJEM (1999) Estimating the Integral Non-Linearity of Ad-Converters via the Frequency Domain. International Test Conference (ITC’99) 757

  2. Kuijstermans FCM, Sachdev M, Thijssen AP (1995) Defect-Oriented Test Methodology for Complex Mixed-Signal Circuits. European Design and Test Conference 1995. ED&TC, Proceedings 18–23, 6–9 March

  3. Lindermeir WM, Graeb HE, Antreich KJ (1995) Design based analog testing by Characteristic Observation Inference. Proc. of the 1995 IEEE/ACM Int. Conf. on Computer-Aided Design San Jose, California, USA, 05–09 November, pp 620–626

  4. Starzyk JA, Mohn RP, Liang J (2004) A Cost-Effective Approach to the Design and Layout of a 14-bit Current Steering Dac Macrocell. IEEE TCAS-I 51(1):196–200, January

    Google Scholar 

  5. Van de Plassche RJ (2003) CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters, 2nd edn. Springer, Heidelberg

    MATH  Google Scholar 

Download references

Acknowledgments

We acknowledge Erik Jan Marinissen, Christoph Sarrazin and Rene Jonker at Philips Semiconductors for their good comments on this paper. We acknowledge Patrice Dumond at Philips Semiconductor Zurich, Frank Cuijper, Hoa Pham, Paul Vleugels and Tonnie Wiegman at Philips Semiconductor Nijmegen for their great supports on the final test implementation work. We acknowledge at Philips Semiconductors IMO TIC for initiating this work. This research work was one of the projects in European Medea+ program.

Author information

Authors and Affiliations

  1. Philips Semiconductors IC Manufacturing Operations–Test Innovation Centre, Gerstweg 2, 6534 AE, Nijmegen, The Netherlands

    Lei Ma & Robert van Rijsinge

  2. Philips Semiconductors Chief Technology Office–Process Library Technology, Prof. Holstlaan 4, 5656 AA, Eindhoven, The Netherlands

    Geert Seuren, Corné Bastiaansen & Leon van der Dussen

Authors
  1. Lei Ma
    View author publications

    You can also search for this author inPubMed Google Scholar

  2. Geert Seuren
    View author publications

    You can also search for this author inPubMed Google Scholar

  3. Robert van Rijsinge
    View author publications

    You can also search for this author inPubMed Google Scholar

  4. Corné Bastiaansen
    View author publications

    You can also search for this author inPubMed Google Scholar

  5. Leon van der Dussen
    View author publications

    You can also search for this author inPubMed Google Scholar

Corresponding author

Correspondence to Lei Ma.

Additional information

Responsible Editor: M. Lubaszewski

Rights and permissions

Reprints and permissions

About this article

Cite this article

Ma, L., Seuren, G., Rijsinge, R.v. et al. A Design-Based Structural Test Method for a Switched-Resistor DAC. J Electron Test 23, 559–567 (2007). https://doi.org/10.1007/s10836-007-5011-9

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10836-007-5011-9

Keywords