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Functional Constraints vs. Test Compression in Scan-Based Delay Testing

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Abstract

We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many positions as possible unspecified in order to facilitate test compression. The method is independent of the employed delay fault model, ATPG algorithm and test compression technique, and it is easy to integrate into an existing flow. Experimental results emphasize the severity of overtesting in scan-based delay test. Influence of different functional constraints on the amount of the required test data and the compression efficiency is investigated. To the best of our knowledge, this is the first systematic study on the relationship between overtesting prevention and test compression.

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Notes

  1. Parts of the article have been presented at the Design Automation and Test in Europe (DATE) Conference 2006.

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Acknowledgements

This work was supported in part by 21st Century COE (Center of Excellence) Program “Ubiquitous Networked Media Computing” and in part by JSPS (Japan Society for the Promotion of Science) under Grants-in-Aid for Scientific Research B(2)(No. 15300018). We are thankful to Prof. Sudhakar M. Reddy for fruitful discussions on overtesting.

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Authors and Affiliations

  1. Institute of Computer Science, Albert-Ludwigs-University, Georges-Köhler-Allee 51, 79110, Freiburg im Breisgau, Germany

    Ilia Polian

  2. Graduate School of Information Science, Nara Institute of Science and Technology, Nara, Japan

    Hideo Fujiwara

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  1. Ilia Polian
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  2. Hideo Fujiwara
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Correspondence to Ilia Polian.

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Responsible Editor: A. Parekhji

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Polian, I., Fujiwara, H. Functional Constraints vs. Test Compression in Scan-Based Delay Testing. J Electron Test 23, 445–455 (2007). https://doi.org/10.1007/s10836-007-5013-7

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  • DOI: https://doi.org/10.1007/s10836-007-5013-7

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