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Guest Editorial

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Acknowledgment

The guest editors would like to take this opportunity to thank Editor-in-Chief Vishwani Agrawal for his support and thank the authors and reviewers for all their work in making this issue possible.

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Authors and Affiliations

  1. Department of Electrical and Computer Engineering, University of Texas at Austin, 1 University Station, #C0803, Austin, TX, 78712-1084, USA

    Nur Touba

  2. Department of Electronic Engineering, University of Rome “Tor Vergata”, Vis del Politecnico 1, 00133, Rome, Italy

    Adelio Salsano

  3. Missouri University of Science and Technology, 134 Emerson Electric Co. Hall, Rolla, MO, 65409-0040, USA

    Minsu Choi

Authors
  1. Nur Touba
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  2. Adelio Salsano
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  3. Minsu Choi
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Correspondence to Nur Touba.

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Touba, N., Salsano, A. & Choi, M. Guest Editorial. J Electron Test 24, 9–10 (2008). https://doi.org/10.1007/s10836-008-5067-1

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  • DOI: https://doi.org/10.1007/s10836-008-5067-1

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