Skip to main content
SpringerLink
Log in

Test Points Selection for Analog Fault Dictionary Techniques

  • Published:
Journal of Electronic Testing Aims and scope Submit manuscript

Abstract

The test points selection problem for analog fault dictionary is researched extensively in many literatures. Various test points selection strategies and criteria for Integer-Coded fault wise table are described and compared in this paper. Firstly, the construction method of Integer-Coded fault wise table for analog fault dictionary is described. Secondly, theory and algorithms associated with these strategies and criteria are reviewed. Thirdly, the time complexity and solution accuracy of existing algorithms are analyzed and compared. Then, a more accurate test points selection strategy is proposed based on the existing strategies. Finally, statistical experiments are carried out and the accuracy and efficiency of different strategies and criteria are compared in a set of comparative tables and figures. Theoretical analysis and statistical experimental results given in this paper can provide an instruction for coding an efficient and accurate test points selection algorithm easily.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4

Similar content being viewed by others

Abbreviations

S opt :

Desired test points set.

S c :

Candidate test points set.

n j :

Test point j.

N T :

Number of candidate test points.

f i :

Fault i.

N F :

Number of all potential faults (including the nominal case).

k i :

Number of test point (or graph node) that can isolate fault f i .

q j :

Number of faults that can be isolated by n j .

\(S_i^j \) :

Ambiguity set i in test point n j , defined as:

\(S_i^j = \left\{ {f_m \left| {a_{mj} = i,0 < m < N_F } \right.} \right\}\), where a mj :

is element of fault dictionary corresponding to the m th fault (row) and j th test point (column).

F ij :

Number of faults in ambiguity set \(S_i^j \).

N Aj :

Number of ambiguity sets in n j or in graph node j.

References

  1. Abderrahman A, Cerny E, Kaminska B (1996) Optimization-based multifrequency test generation for analog circuits. J. Journal of Electronic Testing: Theory and Applications 9:59–73 doi:10.1007/BF00137565

    Article  Google Scholar 

  2. Aho A, Hopcroft J, Ullman J (1974) The design and analysis of computer algorithms. Reading, MA, Addison-Wesley

    MATH  Google Scholar 

  3. Augusto JS, Almeida C (2006) A tool for test points selection and single fault diagnosis in linear analog circuits. In Proc XXI Intl Conf On Design of Systems and Integrated Systems DCIS′06, Barcelona, Spain

    Google Scholar 

  4. Deb S, Pattipati KR, Raghavan V, Shakeri M, & Shrestha R (1995) Multi-signal flow graphs : A novel approach for system testability analysis and fault diagnosis. IEEE Aerospace and Electronics Magazine

  5. Golonek T, Rutkowski J (2007) Genetic-algorithm-based method for optimal analog test points selection. IEEE Transactions on Circuits and Systems—II. Express Briefs 54(2):117–121 doi:10.1109/TCSII.2006.884112

    Article  Google Scholar 

  6. Hochwald W, Bastian JD (1979) A dc approach for analog fault dictionary determination. IEEE Transactions on Circuits and Systems CAS-26:523–529 doi:10.1109/TCS.1979.1084665

    Article  Google Scholar 

  7. Horowitz E, Sahni S (1978) Fundamentals of computer algorithms. Potomac, MD, Computer Science

    MATH  Google Scholar 

  8. Lin PM, Elcherif YS (1985) Analogue circuits fault dictionary—New approaches and implementation. Inl J Circuit Theory Appl 13:149–172 doi:10.1002/cta.4490130205

    Article  Google Scholar 

  9. Pinjala KK, Kim BC (2003) An approach for selection of test nodes for analog fault diagnosis. Proceedings of the 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems 3:278–294

  10. Prasad VC, Rao Pinjala SN (1995) Fast algorithms for selection of test nodes of an analog circuit using a generalized fault dictionary approach. Circuits Syst Signal Process 14(6):707–724 doi:10.1007/BF01204680

    Article  MATH  Google Scholar 

  11. Prasad VC, Babu NSC (2000) Selection of test nodes for analog fault diagnosis in dictionary approach. IEEE Transactions on Instrumentation and Measurement 49:1289–1297 doi:10.1109/19.893273

    Article  Google Scholar 

  12. Shakeri M, Raghavan V, Pattipati KR, Patterson-Hine A (2000) Sequential testing algorithms for multiple fault diagnosis. IEEE Trans SMC Part A: systems humans 30:1–14 doi:10.1109/3468.823474

    Article  Google Scholar 

  13. Spaandonk J, & Kevenaar T (1996) Iterative test-point selection for analog circuits. in Proc. 14th VLSI Test Symp 66–71

  14. Starzyk JA, Liu D, Liu Z-H, Nelson DE, Rutkowski JO (2004) Entropy-based optimum test nodes selection for analog fault dictionary techniques. IEEE Transactions on Instrumentation and Measurement 53:754–761 doi:10.1109/TIM.2004.827085

    Article  Google Scholar 

  15. Stenbakken GN, Souders TM (1987) Test points selection and testability measure via QR factorization of linear models. IEEE Transactions on Instrumentation and Measurement 36(6):406–410

    Google Scholar 

  16. Varghese X, Williams JH, Towill DR (1978) Computer-aided feature selection for enhanced analog system fault location. Pattern Recognition 10:265–280 doi:10.1016/0031-3203(78)90036-5

    Article  Google Scholar 

  17. Wang W, Hu QH, & Yu D (2007) Application of Multivalued Test Sequencing to fault diagnosis. ICEMI

  18. Yang CL, Tian SL, & Long B Application of Heuristic Graph Search to Test Points Selection for Analog Fault Dictionary Techniques. To be published in IEEE Trans Instrum Meas in June 2009

Download references

Acknowledgments

This work was supported in part by Commission of Science Technology and Industry for National Defense of China (No.A1420061264), and by RFDP(The Research Fund for the Doctoral Program of Higher Education)(No. 20070614018).

Author information

Authors and Affiliations

  1. School of Automation engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China

    Chenglin Yang, Shulin Tian & Bing Long

Authors
  1. Chenglin Yang
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Shulin Tian
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Bing Long
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Chenglin Yang.

Additional information

Responsible Editor: J. W. Sheppard

Rights and permissions

Reprints and permissions

About this article

Cite this article

Yang, C., Tian, S. & Long, B. Test Points Selection for Analog Fault Dictionary Techniques. J Electron Test 25, 157–168 (2009). https://doi.org/10.1007/s10836-008-5097-8

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10836-008-5097-8

Keywords

Search

Navigation