Abstract
Using the timing flexibility of modern automatic test equipment (ATE) test response data can be compacted without the need for additional X-masking logic. In this article the test response is compacted by several multiple input shift registers without feedback (NF-MISR). The shift registers are running on a k-times higher clock frequency than the test clock. For each test clock cycle only one out of the k outputs of each shift register is evaluated by the ATE. The impact of consecutive X values within the scan chains is reduced by a periodic permutation of the NF-MISR inputs. As a result, no additional external control signals or test set dependent control logic is required. The benefits of the proposed method are shown by the example of an implementation on a Verigy ATE. Experiments on three industrial circuits demonstrate the effectiveness of the proposed approach in comparison to a commercial DFT solution.
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Acknowledgment
This work is part of the MAYA project (project label: 01M3172A) funded by the German Ministry for Education and Research (BMMF).
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Hilscher, M., Braun, M., Richter, M. et al. X-tolerant Test Data Compaction with Accelerated Shift Registers. J Electron Test 25, 247–258 (2009). https://doi.org/10.1007/s10836-009-5107-5
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DOI: https://doi.org/10.1007/s10836-009-5107-5