Skip to main content
Springer Nature Link
Log in

ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method

  • Published:
Journal of Electronic Testing Aims and scope Submit manuscript

Abstract

This paper introduces a method to reduce the requirements of the test sources for evaluating the non-linearity characteristics of Analogue-to-Digital converters. The method is based on a non-interleaved Double-Histogram test independent of the test signal waveform. It has been validated by simulation results in a 16-bit pipeline A/D converter and by an experimental example using the AD6644 commercial converter.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7
Fig. 8
Fig. 9
Fig. 10
Fig. 11
Fig. 12
Fig. 13

Similar content being viewed by others

References

  1. Attivissimo F, Giaquinto N, Kale I (2004) INL reconstruction of A/D converters via parametric spectral approach. IEEE Trans on Instrument and Meas 53(3):940–946

    Article  Google Scholar 

  2. Jalon MA, Rueda A, Peralias E (2009) Enhanced double-histogram test. Electron Lett 45(7):349–351

    Article  Google Scholar 

  3. Janik JM, fresnaud V (2007) A spectral approach to estimate the INL of A/D converter; Computer Standards & Interfaces 29 (2007) Elsevier, pp.31–37

    Google Scholar 

  4. Jin L, He C, Geiger R (2004) An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. Proceedings of the International Symposium on Circuits and Systems, Vol.1, May 2004, pp. 928–931

  5. Jin L, Parthasarathy K, Kuyel T, Chen D, Geiger RL (2005) Accurate testing of analog-to-digital converters using linearity signals with stimulus error identification and removal. IEEE Trans on Instrum and Meas 54(3):1188–1199

    Article  Google Scholar 

  6. Jin L, Parthasarathy K, Kuyel T, Geiger RL, Chen D (2005) High-performance ADC linearity test using low-precision signals in non-stationary environments. IEEE International Test Conference Proceedings, Nov. 2005

  7. Jin L, Chen D, Geiger RL (2007) SEIR linearity testing of precision A/D converters in nonstationary environments with center-symmetric interleaving. IEEE Transactions on Instrumentation and Measurement 56(5): Oct. 2007

  8. Jin L, Chen D, Geiger RL (2009) Code-density test of analog-to-digital converters using single low-linearity stimulus signal. IEEE Transactions on Instrumentation and Measurement, 58(8): Aug. 2009

  9. Korhonen E, Kostamovaara J (2008) An improved algorithm to identify the stimulus in histogram-based A/D converter testing. Proc. 2008 13th European Test Symp., May 2008, pp. 149–154

  10. Parthasarathy KL, Geiger R (2001) Accurate self characterization and correction of A/D converter performance. Proc. 44th IEEE 2001 Midwest Symposium on Circuits and Systems, 2001 (MWSCAS 2001). Vol. 1, pp. 276–279

  11. Parthasarathy KL, Le J, Degang C, Geiger R (2002) A modified histogram approach for accurate self-characterization of analog-to-digital converters. IEEE International Symposium on Circuits and Systems 2002 (ISCAS 2002). Vol. 2, pp. 376–379

  12. Parthasarathy KL, Le J, Kuyel T, Degang C, Geiger R (2002) A histogram based AM-BIST algorithm for ADC characterization using imprecise stimulus. Proc. 45th IEEE 2002 Midwest Symposium on Circuits and Systems, 2002 (MWSCAS 2002) Vol. 2, pp. 274–277

  13. Peralías EJ, Jalón MA, Rueda A (2008) Simple evaluation of the nonlinearity signature of an ADC using a spectral approach; VLSI Design,Volume 2008, Article ID 657207, 8 pages

  14. IEEE Standard 1241–2000 for Terminology and Test Methods for Analog-to-Digital Converters, Dec. 2000

  15. Stefani F, Macii D, Moschitta A, Carbone P, Petri D (2006) Simple and time-effective procedure for ADC INL estimation. IEEE Trans Instrum Meas 55(4):1383–1389

    Article  Google Scholar 

  16. Vasan BK, Duan J, Zhao C, Geiger RL, Chen DJ (2009) Signal generators for cost effective BIST of ADCs. 19th European Conference on Circuit Theory and Design, Aug. 2009

  17. Wang B, Zhang JQ, Wang Y (2007) A/D converter INL and DNL estimation with a distorted sinusoidal stimulus signal. IEEE Instrumentation and Measurement Technology Conference proceedings

Download references

Acknowledgment

This work has been partially supported by the Spanish TEC2007-68072 project.

Author information

Authors and Affiliations

  1. Instituto de Microelectrónica de Sevilla CNM-CSIC, Parque Tecnológico de La Cartuja, C. Américo Vespucio s/n, 41092, Seville, Spain

    M. A. Jalón & E. Peralías

Authors
  1. M. A. Jalón
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. E. Peralías
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to E. Peralías.

Additional information

Responsible editor: K. Arabi

Rights and permissions

Reprints and permissions

About this article

Cite this article

Jalón, M.A., Peralías, E. ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method. J Electron Test 26, 47–58 (2010). https://doi.org/10.1007/s10836-009-5130-6

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10836-009-5130-6

Keywords

Search

Navigation