Abstract
This paper introduces a method to reduce the requirements of the test sources for evaluating the non-linearity characteristics of Analogue-to-Digital converters. The method is based on a non-interleaved Double-Histogram test independent of the test signal waveform. It has been validated by simulation results in a 16-bit pipeline A/D converter and by an experimental example using the AD6644 commercial converter.
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Acknowledgment
This work has been partially supported by the Spanish TEC2007-68072 project.
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Jalón, M.A., Peralías, E. ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method. J Electron Test 26, 47–58 (2010). https://doi.org/10.1007/s10836-009-5130-6
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DOI: https://doi.org/10.1007/s10836-009-5130-6