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A Novel Test Point Selection Method for Analog Fault Dictionary Techniques

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Abstract

Most of the recently reported test point selection algorithms for analog fault dictionary techniques are based on integer-coded table (ICT) technique. Hence, the accuracy of these algorithms is closely related to the accuracy of the ICT technique. Unfortunately, this technique is not accurate, especially when the size of fault dictionary is large. This paper proposes an accurate fault-pair Boolean table technique for the test point selection problem. First, the approach to transform the fault dictionary into a fault-pair Boolean table is introduced. Then, a test point selection algorithm based on the fault-pair Boolean table is proposed. Thirdly, several example circuits are used to illustrate the proposed algorithm. Simulated results indicate that the proposed method is more accurate than the other methods. Therefore, it is a good solution for minimizing the size of the test point set.

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Authors and Affiliations

  1. University of Electronic science and technology of China, Chengdu, 610054, China

    ChengLin Yang, ShuLin Tian & Bing Long

  2. Chengdu College of Sichuan Normal University, Chengdu, 610054, China

    Fang Chen

Authors
  1. ChengLin Yang
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  2. ShuLin Tian
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  3. Bing Long
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  4. Fang Chen
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Corresponding author

Correspondence to ChengLin Yang.

Additional information

Responsible Editor: J. W. Sheppard

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Yang, C., Tian, S., Long, B. et al. A Novel Test Point Selection Method for Analog Fault Dictionary Techniques. J Electron Test 26, 523–534 (2010). https://doi.org/10.1007/s10836-010-5169-4

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  • DOI: https://doi.org/10.1007/s10836-010-5169-4

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