Abstract
This paper presents new test methods for nonlinear Analog and Mixed-Signal (AMS) circuits which use a pseudorandom signal to test multiple Devices Under Test (DUTs) accurately. The goal of the studies presented in this paper is to understand the behaviors of nonlinear AMS circuits in a low-cost test environment and to develop the algorithm to extract the performance information of the DUTs using simple test measurements. The extracted information is then used to estimate the various specifications of DUTs. In order to achieve this goal, we analyze the behaviors of AMS circuits using a Volterra series model, and investigate the stochastic properties of the pseudorandom signals to develop the efficient performance characterization algorithms. The mathematical theory and experimental results are presented to validate the presented test methods.
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Notes
Main part of the algorithms presented in this section were first introduced in [17]. Those algorithms are presented in this section in order to explain the test methods presented in the next section more efficiently.
Please note that the specification values shown in the Table 2 are smaller than those in the actual specification sheet; this is because the DACs used in our measurement have the effective resolution lower than 12 bits due to the measurement conditions. These conditions apply to both sinusoidal and pseudorandom test measurements.
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Park, J., Shin, H. & Abraham, J.A. Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. J Electron Test 27, 321–334 (2011). https://doi.org/10.1007/s10836-011-5227-6
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DOI: https://doi.org/10.1007/s10836-011-5227-6