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A Modified Simulation-Based Multi-Signal Modeling for Electronic System

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Abstract

Multi-signal model is an effective modeling method applicable to large scale complex system. In this paper, an improved simulation-based modeling method for parametric fault is put forward. Two times of Monte-Carlo simulation are done in normal tolerance. Based on the estimated sample variance obtained from the first Monte-Carlo simulation, the analysis runs of the second Monte-Carlo is determined empirically to reduce the simulation cost. Then the statistical distribution of data from the second Monte-Carlo simulation is judged qualitatively by normality test. After that, an adaptive method is adopted to estimate the threshold range for signal feature in normal state, which can improve modeling precision. At last, the effectiveness of the proposed method is verified and the performances are compared to manifest the advantage of the proposed method. The work in this paper is valuable for future further research of complex system test and diagnosis based on multi-signal.

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Acknowledgment

This paper is supported by “the Fundamental Research Funds for the Central Universities”

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Authors and Affiliations

  1. North China Electric Power University, Beijing, China

    Chen Xiaomei

  2. Beihang University, Beijing, China

    Meng Xiaofeng & Wang Guohua

Authors
  1. Chen Xiaomei
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  2. Meng Xiaofeng
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  3. Wang Guohua
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Correspondence to Chen Xiaomei.

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Responsible Editor: V. D. Agrawal

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Xiaomei, C., Xiaofeng, M. & Guohua, W. A Modified Simulation-Based Multi-Signal Modeling for Electronic System. J Electron Test 28, 155–165 (2012). https://doi.org/10.1007/s10836-011-5273-0

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  • DOI: https://doi.org/10.1007/s10836-011-5273-0

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