Abstract
With recent advances in CMOS process technology, the concept of system-on-a-chip (SoC) has been realized by integrating more and more digital and analog building blocks in a single chip [2, 9]. Additionally, these advances have brought several new types of processes faults (soft fault) and higher process variations to RF circuit resulting performances degradation. In order to compensate the RF circuit performance, a novel efficient self-calibration method for 865–870 MHz low noise amplifiers (LNAs), which constitute a RF mixed-signal circuit, is developed. This technique detects any deviation from the output match and from reverse isolation using built-in self test (BIST) methods, and then provides a corrective measure to recalibrate these LNA performances to the possible optimal value. This proposed self-calibration technique uses a switchable resistor which has been designed to investigate its ability to compensate for output match S22 and reverse isolation S12 without affecting other LNA performances. The use of this method saves space on chip and prevents adding switch resistor noise. In addition, the new calibration design shows the ability to calibrate S22 and S12 due to the catastrophic fault.
Similar content being viewed by others
References
Ayadi R, Masmoudi M (2010) Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs. J Electron Test Theory Appl 26(1):37–45, Springer
Cui Y, Chi B, Liu M, Zhang Y, Li Y, Wang Z, Chiang P (2007) Process variation compensation of a 2.4 GHz LNA in 0.18um CMOS Using Digitall Switchable Capacitance. IEEE International Symposium on Circuits and Systems pp. 2562–2565
Das T, Gopalan A, Washburn C, Mukund PR (2005) Self-calibration of input-match in RF front-end circuitry. IEEE Trans Circuits Syst II Express Briefs 52(12):821–825
Das T, Mukund PR (2009) Self-calibration of gain and output match in LNAs. IEEE International Symposium on Circuits and Systems, pp.4983–4986
Das T, Mukund PR (2007) Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry, DATE07 EDAA
Goyal A, Swaminathan M, Chatterjee A (2009) A novel self-healing methodology for RF amplifier circuits based on oscillation principles, DATE ‘09 Proceedings of the Conference on Design, Automation and Test in Europe, pp. 1656–1661
Gupta R, Allstot DJ (1998) Parasitic-aware design and optimization of CMOS RF integrated circuits, in Dig. IEEE Int Microwave Symp 3:1867–1870
Han D, Akbay SS, Bhattacharya S, Chatterjee A (2005) On-chip self-calibration of RF circuits using specification-driven built-in self test (S-BIST), 11th IEEE International On-Line Testing Symposium, 2005. IOLTS pp. 106–111
Hsieh HH, Lu LH (2006) Integrated CMOS power sensors for RF BIST applications. Proceedings of the 24th IEEE VLSI Test Symposium
Thabet H, Trabelsi H, Masmoudi M, Derbel F (2007) A 3-V, 863–870 MHz Low Noise Amplifier for wireless sensor, Fourth IEEE International Multiconference on Systems, Signals and Devices SSD07, Hammamet, March
Yen-Chih H., Hsieh-Hung H., Liang-Hung L., A Low-Noise Amplifier with integrated current and power sensors for RF BIST Applications, 25th IEEE VLSI Test Symmposium (VTS’07)
Author information
Authors and Affiliations
Corresponding author
Additional information
Responsible Editor: A. Ivanov
Rights and permissions
About this article
Cite this article
Ayadi, R., Mahresi, S. & Masmoudi, M. Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor. J Electron Test 28, 167–176 (2012). https://doi.org/10.1007/s10836-012-5283-6
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10836-012-5283-6