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FAST: An RTL Fault Simulation Framework based on RTL-to-TLM Abstraction

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Abstract

Functional verification techniques based on fault injection and simulation at register-transfer level (RTL) have been largely investigated in the past years. Although they have various advantages such as scalability and simplicity, they commonly suffer from the low speed of the cycle-accurate RTL simulation. On the other hand, Transaction-level modeling (TLM) allows a simulation speed sensibly faster than RTL. This article presents FAST, a framework to accelerate RTL fault simulation through automatic RTL-to-TLM abstraction. FAST abstracts RTL models injected with any RTL fault model into equivalent injected TLM models thus allowing a very fast fault simulation at TLM level. The article also presents FAST-DT, a new bit-accurate data type library integrated in the framework that allows a further improvement of the simulation speed-up. Finally, the article shows how the generated TLM test patterns can be automatically synthesized into RTL test patterns by exploiting the structural information of the RTL model extracted during the abstraction process. Experimental results have been performed on several designs of different size and complexity to show the methodology effectiveness.

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Authors and Affiliations

  1. Department of Computer Science, University of Verona, Verona, Italy

    Nicola Bombieri, Franco Fummi & Valerio Guarnieri

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  1. Nicola Bombieri
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  2. Franco Fummi
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  3. Valerio Guarnieri
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Correspondence to Nicola Bombieri.

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Responsible Editor: C. Metra

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Bombieri, N., Fummi, F. & Guarnieri, V. FAST: An RTL Fault Simulation Framework based on RTL-to-TLM Abstraction. J Electron Test 28, 495–510 (2012). https://doi.org/10.1007/s10836-012-5318-z

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  • DOI: https://doi.org/10.1007/s10836-012-5318-z

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