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Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients

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Abstract

This paper is an exposition of recent advances made in polynomial coefficient and V-transform coefficient based testing of parametric faults in linear and non-linear analog circuits. V-transform is a non-linear transform that increases the sensitivity of polynomial coefficients with respect to circuit component variations by three to five times. In addition, it makes the original polynomial coefficients monotonic. Using simulation, the proposed test method is shown to uncover most parametric faults in the range of 5–15 % on a low noise amplifier (LNA) and an elliptic filter benchmark. Diagnosis of parametric faults clearly illustrates the effect of enhanced sensitivity through V-transform. Finally, we report an experimental validation of the polynomial coefficient based test scheme, with and without V-transform, using the National Instruments’ ELVIS bench-top testbed. The result demonstrates the benefit of V-transform.

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References

  1. Abderrahman A, Cerny E, Kaminska B (1996) Optimization based multifrequency test generation for analog circuits. J Electron Test: Theory Appl 9(1–2):59–73

    Article  Google Scholar 

  2. Chakravarty S, Thadikaran PJ (1997) Introduction to IDDQ testing. Springer

  3. Cherubal S, Chatterjee A (2001) Test generation based diagnosis of device parameters for analog circuits. In: Proc design, automation and test in Europe conf, pp 596–602

  4. Devarayanadurg G, Soma M (1994) Analytical fault modeling and static test generation for analog ICs. In: Proc int conf on computer-aided design, pp 44–47

  5. Farchy SL, Gadzheva ED, Raykovska LH, Kouyoumdjiev TG (1995) Nullator-norator approach to analogue circuit diagnosis using general-purpose analysis programmes. Int J Circuit Theory Appl 23(6):571–585

    Article  Google Scholar 

  6. Figueras J (1997) Possibilities and limitations of IDDQ testing in submicron CMOS. In: Proc innovative systems in silicon conf, pp 174–185

  7. Gulati RK, Hawkins CF (1993) IDDQ testing of VLSI circuits. Springer

  8. Guo Z, Savir J (2003) Analog circuit test using transfer function coefficient estimates. In: Proc int test conf, pp 1155–1163

  9. Lindermeir WL, Graeb HE, Antreich KJ (1999) Analog testing by characteristic observation inference. IEEE Trans Comput-Aided Des 23(6):1353–1368

    Article  Google Scholar 

  10. Panic V, Milovanovic D, Petkovic P, Litovski V (1995) Fault location in passive analog RC circuits by measuring impulse response. In: Proc 20th int conf on microelectronics, pp 12–14

  11. Papoulis A (1965) Probability, random variables, and stochastic processes. McGraw-Hill

  12. Rajsuman R (1995) IDDQ testing for CMOS VLSI. Artech House

  13. Sindia S, Agrawal VD, Singh V (2011) Non-linear analog circuit test and diagnosis under process variation using V-transform coefficients. In: Proc 29th IEEE VLSI test symposium, pp 64–69

  14. Sindia S, Singh V, Agrawal VD (2009) Multi-tone testing of linear and nonlinear analog circuits using polynomial coefficients. In: Proc Asian test symposium, pp 63–68

  15. Sindia S, Singh V, Agrawal VD (2009) Polynomial coefficient based DC testing of non-linear analog circuits. In: Proc 19th ACM Great Lakes symp on VLSI, pp 69–74

  16. Sindia S, Singh V, Agrawal VD (2010) Parametric fault diagnosis of nonlinear analog circuits using polynomial coefficients. In: Proc 23rd international conf VLSI design, pp 288–293

  17. Slamani M, Kaminska B (1992) Analog circuit fault diagnosis based on sensitivity computation and functional testing. IEEE Des Test Comput 19(1):30–39

    Article  Google Scholar 

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Correspondence to Suraj Sindia.

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Responsible Editor: D. Keezer

Appendix

Appendix

Theorem 1

If coefficient a i is a monotonic function of all parameters, then a i takes its limit (maximum and minimum) values when at least one or more of the parameters are at the boundaries of their individual hypercube.

Proof

Let a i be a function of three parameters say x, y and z. Let a i reach its maximum value for (x0, y0, z0). Further let \(\rm{x_0,~y_0} \ne \alpha\). Now if we can show that the maximum value of the coefficient a i occurs at the z0 = α we have proved the theorem. From definition of monotonic dependence of a i on circuit parameters, it follows that a i (x0, y0, α) ≥ ai(x0, y0, z0), ∀ z0 ≤ α. Because the maximum value taken by z is α, it follows that z0 = α. With similar arguments we can show that the minimum value for the coefficient occurs when z0 = − α. Hence, the statement of theorem follows. □

Theorem 2

In polynomial expansion of a non-linear analog circuit there exists at least one coefficient that is a monotonic function of all of the circuit parameters.

Proof

Consider the block diagram in Fig. 14, which models an 2nth order non-linear analog circuit. It has an input x and an output y. Constants a1 ⋯ an are added at the input of each stage. The coefficient corresponding to input x raised to the 2nth power is given by G, as follows:

$$ \rm G=\prod\limits_{{\rm{i = 1}}}^{\rm{n}} {{\rm{g}}_{\rm{i}}^{\rm{2i}} } $$
(28)

where gi  ∀ i = 1 ...n are the monotonic gains of individual stages in the cascaded blocks. As the product of two or more monotonic functions is also monotonic we have G to be a monotonic function. G constitutes the coefficient of the nth power of x in this expansion, as it lines in the main signal flow path from input to output. Thus, it is proved that there is at least one monotonically varying coefficient in a polynomial expansion of a Non-Linear analog circuit. Further, in general the coefficient of 2nth power of such a polynomial expansion is monotonic.□

Fig. 14
figure 14

A system model for a non-linear circuit

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Sindia, S., Agrawal, V.D. & Singh, V. Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients. J Electron Test 28, 757–771 (2012). https://doi.org/10.1007/s10836-012-5326-z

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