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The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits

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Abstract

This paper discusses the different sensitivities of laser-induced single-event transients (SET) with changed temperature (from 300 to 348 K) for an analog/mixed-signal DC/DC PWM controller IC. Basic analog circuits, such as the amplifier, the comparator, and the current mirror, are selected to perform the experiment. The SET energies for some devices decrease while those for others remain constant. The spice simulation implies that the temperature-induced quiescent operating point shift can dramatically affect the SET sensitivity, especially in a complex analog/mixed-signal system. This effect also gives insights on radiation hardened design and testing in analog/mixed-signal circuits.

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Acknowledgments

This work was supported in parts by NSERC, the Cisco Systems Inc. and Intersil Inc.

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Authors and Affiliations

  1. Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada

    Yi Ren & Li Chen

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  1. Yi Ren
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  2. Li Chen
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Correspondence to Yi Ren.

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Responsible Editor: K. Saluja

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Ren, Y., Chen, L. The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits. J Electron Test 30, 377–382 (2014). https://doi.org/10.1007/s10836-014-5448-6

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  • DOI: https://doi.org/10.1007/s10836-014-5448-6

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