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Test and Reliability in Approximate Computing

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Abstract

This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.

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Acknowledgements

The authors of the paper would like to acknowledge the European Union’s H2020 research and innovation program under the Marie Skłodowska-Curie grant agreement No 691178, NANOxCOMP RISE project for partially supporting this work.

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Authors and Affiliations

  1. TIMA Laboratory, University of Grenoble Alpes/CNRS, F-38000, Grenoble, France

    Lorena Anghel, Mounir Benabdenbi & Elena Ioana Vatajelu

  2. LIRMM CNRS/UM, Montpellier, France

    Alberto Bosio & Marcello Traiola

Authors
  1. Lorena Anghel
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  2. Mounir Benabdenbi
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  3. Alberto Bosio
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  4. Marcello Traiola
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  5. Elena Ioana Vatajelu
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Corresponding author

Correspondence to Elena Ioana Vatajelu.

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Responsible Editor: S. T. Chakradhar

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Anghel, L., Benabdenbi, M., Bosio, A. et al. Test and Reliability in Approximate Computing. J Electron Test 34, 375–387 (2018). https://doi.org/10.1007/s10836-018-5734-9

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  • DOI: https://doi.org/10.1007/s10836-018-5734-9

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