Abstract
In this paper, we have considered a methodical approach to forecast the consequences of the influence of pulsed electromagnetic fields on electronic devices based on three defined conditions of the disruption of device functioning. The approach is based on the use of key parameters of pulse disturbances in critical circuits of electronic devices. Depending on the problem being solved and features of the object being tested, the key parameters can be: the amplitude of a voltage pulse in a critical circuit of an object; the Joule integral; the energy; the frequency of repetition of influencing pulses; the probability of a bit error; the number of errors in a transferred data packet; the data rate, etc.
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This work was supported by International Science & Technology Cooperation Program of China (No.2013DFR70610).
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Chepelev, V., Parfenov, Y., Radasky, W. et al. Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP. J Electron Test 34, 547–557 (2018). https://doi.org/10.1007/s10836-018-5749-2
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DOI: https://doi.org/10.1007/s10836-018-5749-2