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Role of the Pulse Repetition Rate when Assessing Electromagnetic Immunity of Electronic Devices

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Abstract

Considering the shortcomings of the existing test methods, this paper provides a new procedure for validating the requirements on the repetition rate of repeating electromagnetic pulses when assessing the electromagnetic immunity of electronic devices. The pulse repetition rate should not be chosen arbitrarily, but should be consistent with the properties of the device under test. Two examples of a 60 W electrical power unit and a “Panasonic” video camera are presented to validate the conclusion in the paper.

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Authors and Affiliations

  1. Russian Academy of Sciencies, Joint Institute for High Temperatures, Moscow, Russia

    Yury Parfenov & Vladimir Chepelev

  2. High Voltage Technology Division, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China

    Yu-hao Chen & Yan-zhao Xie

Authors
  1. Yury Parfenov
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  2. Vladimir Chepelev
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  3. Yu-hao Chen
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  4. Yan-zhao Xie
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Correspondence to Yan-zhao Xie.

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Responsible Editor:  S. Sindia

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Parfenov, Y., Chepelev, V., Chen, Yh. et al. Role of the Pulse Repetition Rate when Assessing Electromagnetic Immunity of Electronic Devices. J Electron Test 36, 671–676 (2020). https://doi.org/10.1007/s10836-020-05908-y

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  • DOI: https://doi.org/10.1007/s10836-020-05908-y

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