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Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit

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Abstract

Alternate test can dramatically reduce the cost of circuit testing. In one type of alternate test, copies of parts of the circuit and process-control monitors (PCM) are used as non-intrusive sensors for calibration algorithms, which can be time-consuming. A straightforward design procedure for process-aware sensors is proposed and proved efficient, and calibration results with process-aware sensors of different sizes are compared. Device size variation and process variation were found to have an impact on the mapping accuracy of the model. In addition, the results were found to degrade with a decrease in sensor size. Specifically, the low-noise amplifier (LNA) pass ratios with the largest sensor size were 3% ~ 4.5% less than the ratios obtained without the prediction error of alternate test. When the size of sensors was reduced by up to 30 times, the LNA pass ratio dropped by 5% ~ 7%.

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Data availability

The datasets generated during and/or analyzed during the current study are available from the corresponding author on reasonable request.

References

  1. Agarwal A, Paul B-C, Mahmoodi H, Datta A, Roy K (2005) A process-tolerant cache architecture for improved yield in nanoscale technologies. IEEE Trans Very Large Scale Integr (VLSI) Syst 13(1):27–38

    Article  Google Scholar 

  2. Abdallah L, Stratigopoulos H-G, Mir S (2013) True non-intrusive sensors for RF built-in test. IEEE Int Test Conf (ITC) 1–10

  3. Abdallah L, Stratigopoulos H-G, Mir S, Altet J (2012) Testing RF circuits with true non-intrusive built-in sensors. Des Autom Test Eur Conf Exhibit (DATE) 1090–1095

  4. Abdallah L, Stratigopoulos H-G, Mir S, Kelma C (2011) RF front-end test using built-in sensors. IEEE Des Test Comput 28(6):76–84

    Article  Google Scholar 

  5. Abdallah L, Stratigopoulos H-G, Mir S, Kelma C (2012) Experiences with non-intrusive sensors for RF built-in test. IEEE Int Test Conf 1–8

  6. Andraud M, Stratigopoulos H-G, Simeu E (2014) One-shot calibration of RF circuits based on non-intrusive sensors. ACM/EDAC/IEEE Des Autom Conf (DAC) 1–6

  7. Andraud M, Stratigopoulos H-G, Simeu E (2016) One-shot non-intrusive calibration against process variations for analog/RF circuits. IEEE Trans Circuits Syst I Regul Pap 63(11):2022–2035

    Article  Google Scholar 

  8. Barragan M-J, Fiorelli R, Leger G, Rueda A, Huertas JL (2011) Alternate test of LNAs through ensemble learning of on-chip digital envelope signatures. J Electron Test 27(3):277–288

    Article  Google Scholar 

  9. Bou-Sleiman S, Ismail M (2011) Built-in-self-test and Digital Self-calibration for RF SoCs. Springer Science & Business Media

  10. Cilici F, Barragan M-J, Lauga-Larroze E, Bourdel S, Leger G, Vincent L, Mir S (2020) A nonintrusive machine learning-based test methodology for millimeter-wave integrated circuits. IEEE Trans Microw Theory Tech 68(8):3565–3579

    Article  Google Scholar 

  11. Cilici F, Barragan M-J, Mir S, Lauga-Larroze E, Bourdel S (2018) Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits. IEEE Eur Test Symp (ETS) 1–6

  12. Cilici F, Barragan M-J, Mir S, Lauga-Larroze E, Bourdel S, Leger G (2019) Yield recovery of mm-wave power amplifiers using variable decoupling cells and one-shot statistical calibration. IEEE Int Symp Circuits Syst (ISCAS) 1–5

  13. Dimakos A, Stratigopoulos H-G, Siligaris A, Mir S, De Foucauld E (2014) Non-intrusive built-in test for 65nm RF LNA. Ann Int Mixed-Signals Sens Syst Test Workshop Proc 1–6

  14. Dimakos A, Stratigopoulos H-G, Siligaris A, Mir S, Foucauld E-D (2015) Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors. J Electron Test 31(4):381–394

    Article  Google Scholar 

  15. Dimakos A, Andraud M, Abdallah L, Stratigopoulos H-S, Simeu E, Mir S (2015) Test and calibration of RF circuits using built-in non-intrusive sensors. IEEE Comput Soc Ann Symp VLSI 627–627

  16. Dimakos A, Stratigopoulos H-G, Siligaris A, Mir S, De Foucauld E (2016) Built-in test of millimeter-wave circuits based on non-intrusive sensors. Des Autom Test Eur Conf Exhibit (DATE) 505–510

  17. Ghosh S, Roy K (2010) Parameter variation tolerance and error resiliency: New design paradigm for the nanoscale era. Proc IEEE 98(10):1718–1751

    Article  Google Scholar 

  18. Han D, Kim B-S, Chatterjee A (2009) DSP-driven self-tuning of RF circuits for process-induced performance variability. IEEE Trans Very Large Scale Integr (VLSI) Syst 18(2):305–314

    Article  Google Scholar 

  19. Hornik K, Stinchcombe M, White H (1989) Multilayer feedforward networks are universal approximators. Neural Netw 2(5):359–366

    Article  MATH  Google Scholar 

  20. Larguech S, Azais F, Bernard S, Comte M, Kerzerho V, Renovell M (2015) Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategy. Microelectron J 46(11):1091–1102

    Article  Google Scholar 

  21. Liaperdos J, Arapoyanni A, Tsiatouhas Y (2013) Adjustable RF mixers’ alternate test efficiency optimization by the reduction of test observables. IEEE Trans Comput Aided Des Integr Circuits Syst 32(9):1383–1394

    Article  Google Scholar 

  22. Lu Y, Subramani K-S, Huang H, Kupp N, Huang K, Makris Y (2015) A comparative study of one-shot statistical calibration methods for analog/RF ICs. IEEE Int Test Conf (ITC) 1–10

  23. Mittal S (2016) A Survey of Architectural Techniques for Managing Process Variation. ACM Computing Surveys (CSUR) 48(4):1–29

    Google Scholar 

  24. Pan Z, Qin C, Ye Z, Wang Y, Yu Z (2017) Wideband inductorless low-power LNAs with Gm enhancement and noise-cancellation. IEEE Trans Circuits Syst I Regul Pap 65(1):26–38

    Article  Google Scholar 

  25. Possignolo R-T, Ebrahimi E-N, Ardestani E-K, Sankaranarayanan A, Briz J-L, Renau J (2018) GPU NTC process variation compensation with voltage stacking. IEEE Trans Very Large Scale Integr (VLSI) Syst 26(9):1713–1726

    Article  Google Scholar 

  26. Seyedi H, Dehdasht-Heydari R, Roshani S (2019) A novel LNA with noise cancellation in 4–11.5 GHz bandwidth for UWB receivers. Microelectron J 88:99–107

    Article  Google Scholar 

  27. Stratigopoulos H-G, Mir S (2012) Adaptive alternate analog test. IEEE Des Test Comput 29(4):71–79

    Article  Google Scholar 

  28. Tang X, De VK, Meindl JD (1997) Intrinsic MOSFET parameter fluctuations due to random dopant placement. IEEE Trans Very Large Scale Integr (VLSI) Syst 5(4):369–376

    Article  Google Scholar 

  29. The BSIM Group of UC Berkley (2015) BSIM6.1.1 MOSFET Compact Model Technical Manual. http://bsim.berkeley.edu/models/bsimbulk/. Accessed 19 Dec 2021

  30. Variyam P-N, Cherubal S, Chatterjee A (2002) Prediction of analog performance parameters using fast transient testing. IEEE Trans Comput Aided Des Integr Circuits Syst 21(3):349–361

    Article  Google Scholar 

  31. Xiao W, Wu W, Chang Y, Diao J, Qiao Y, Liu X, He S, Liu X, Guo D (2021) A non-intrusive self-calibration method for the circuit design of inductorless low noise amplifier. 2021 IEEE 15th Conference on Anti-counterfeiting, Security, and Identification (ASID) Xiamen, Fujian, China, pp 57–60

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Acknowledgment

This work is supported by the National key research and development plan project: 2019YFB2204601.

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Authors and Affiliations

  1. School of Electronic Science and Engineering, Xiamen University, Xiamen, Fujian, 361000, China

    Wenrun Xiao, Jidong Diao, Yanping Qiao, Xianming Liu, Shan He & Donghui Guo

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  1. Wenrun Xiao
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  2. Jidong Diao
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  3. Yanping Qiao
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  4. Xianming Liu
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  5. Shan He
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  6. Donghui Guo
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Correspondence to Donghui Guo.

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Xiao, W., Diao, J., Qiao, Y. et al. Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit. J Electron Test 39, 41–55 (2023). https://doi.org/10.1007/s10836-022-06042-7

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  • DOI: https://doi.org/10.1007/s10836-022-06042-7

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