Abstract
On-line performance monitoring of RF integrated circuits throughout their operating lifetime is a promising way to enhance their reliability. This paper explores the feasibility of adapting the indirect test strategy to implement on-line RF performance monitoring. After stating the principle of the proposed solution, we consider the fundamental requirements necessary to adapt the indirect test strategy. Finally, a proof of concept is established through a practical case of study by monitoring the power level delivered by the RF transmitter of a wireless microcontroller: hardware measurement results demonstrate the potential of this approach.
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Data Availability
The data collected and analyzed in this study are not publicly available in order to preserve NXP Semiconductors' industrial confidentiality.
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El Badawi, H., Azais, F., Bernard, S. et al. On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. J Electron Test 39, 155–170 (2023). https://doi.org/10.1007/s10836-023-06058-7
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DOI: https://doi.org/10.1007/s10836-023-06058-7