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Intelligent maintenance prediction system for LED wafer testing machine

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Abstract

Achieving high quality production of light-emitting diode (LED) wafers requires robust monitoring and the use of a stable test machine. In many factories, production continues 24 h a day. Stopping the manufacturing process at a factory is often difficult. Therefore, reducing inspection time and ensuring the stability of test machines are important. Traditionally, LED wafer factories examine their test machines during periodic maintenance. Standard lamp adjustments are performed to ensure their accuracy. This process interrupts the manufacturing process and requires extra manpower. It reduces productivity and increases production cost. Additionally, the accurate assessment of the aging of the components of the machine requires an experienced engineer. Correctly timing the maintenance and replacing the aging components of the LED wafer test machine are important. This work performed feature extraction to identify the working attributes of an LED wafer test machine. The intelligent maintenance prediction system then uses the radial basis function neural network and variability of the working attributes to predict the maintenance times and aging of the LED wafer test machines. Experimental results reveal that the accuracy of proposed system in predicting maintenance times exceeds 98 %.

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Authors and Affiliations

  1. Department of Computer Science and Information Engineering, Fu-Jen Catholic University, 510 Chung Cheng Rd., Hsinchuang Dist., New Taipei City , 242, Taiwan, ROC

    Chien-Chang Hsu & Min-Sheng Chen

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  1. Chien-Chang Hsu
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  2. Min-Sheng Chen
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Correspondence to Chien-Chang Hsu.

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Hsu, CC., Chen, MS. Intelligent maintenance prediction system for LED wafer testing machine. J Intell Manuf 27, 335–342 (2016). https://doi.org/10.1007/s10845-013-0866-3

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  • DOI: https://doi.org/10.1007/s10845-013-0866-3

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