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Generation of Positive and Negative Tests for Parsers

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Abstract

A methodology for automatic positive and negative test set generation for testing parsers is described. Coverage criteria for such test sets based on the model approach to testing are proposed. Methods for the generation of test sets satisfying these criteria are discussed. Results of the application of the proposed methodology for testing parsers for various languages including C and Java are presented.

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Authors and Affiliations

  1. Institute for System Programming, Russian Academy of Sciences, ul. Bol'shaya Kommunisticheskaya 25, Moscow, 109004, Russia

    S. V. Zelenov & S. A. Zelenova

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  1. S. V. Zelenov
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  2. S. A. Zelenova
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__________

Translated from Programmirovanie, Vol. 31, No. 6, 2005.

Original Russian Text Copyright © 2005 by Zelenov, Zelenova.

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Zelenov, S.V., Zelenova, S.A. Generation of Positive and Negative Tests for Parsers. Program Comput Soft 31, 310–320 (2005). https://doi.org/10.1007/s11086-005-0040-6

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  • DOI: https://doi.org/10.1007/s11086-005-0040-6

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