Abstract
Under the complex environmental of the front-end manufacturing process of semiconductors, on-site managers are concerned about the production performance of the bottleneck machine, hoping to predict the future production volume as a reference for future production decisions in Internet of Things (IoT). In this study, we proposed neural network methods were used to predict production performance by using genetic programming (GP) and backward propagation neural network (BPN). GP is applied to numerical prediction to calculate the difference between the actual output value and the predicted output value. BPN can be divided into an input layer processing unit, a hidden layer processing unit, and an output layer processing unit, which can be divided into three different functional layers. This study uses the production data of semiconductor manufacture factory to compare the results of bottleneck machine production performance predictions carried out by GP and BPN methods. The result show that the average prediction accuracy of the two methods are reaching the high level of practical requirements and indicates BPN is better than GP method. Both methods can provide a reference for manager practical to make decisions to improve production performance in semiconductor industry.
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Liu, Z. Using neural network to establish manufacture production performance forecasting in IoT environment. J Supercomput 78, 9595–9618 (2022). https://doi.org/10.1007/s11227-021-04210-8
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DOI: https://doi.org/10.1007/s11227-021-04210-8