Abstract
Defects in printed circuit boards (PCBs) can degrade the performance and reliability of electronic devices. Although YOLOv5-based algorithms are commonly used to detect PCB defects, their complex parameters slow down detection speeds on industrial platforms. This paper presents a lightweight, high-performance model for PCB defect detection, called Align Soft-Target Knowledge Distillation PCB Lightweight Defect Detection (ASTKD-PCB-LDD). The model uses the k-means++ algorithm for optimal anchor box selection and the SCYLLA-IoU (SIoU) loss function to improve accuracy in detecting small defects. The Faster-Ghost backbone network and slim-neck architecture reduce computational load and improve inference speed. Additionally, Align Soft-Target Knowledge Distillation (ASTKD) is applied, with the PCB-LDD model as the teacher and a pruned model-created using Layer-Adaptive Magnitude-based Pruning (LAMP)-as the student. This strategy helps to maintain detection accuracy while reducing model size. Experimental results show that the model size is reduced from 14.5 to 4 MB (a 27.6\(\%\) reduction), achieving 98\(\%\) mean average precision (mAP), and the detection speed increases from 73.2 frames/s to 112.3 frames/s, improving by 153.4\(\%\). Moreover, the model demonstrates strong applicability and scalability. This approach effectively combines performance and lightweight design, significantly enhancing PCB defect detection efficiency.












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Tsai D-M, Chou Y-H (2019) Fast and precise positioning in PCBS using deep neural network regression. IEEE Trans Instrum Meas 69(7):4692–4701
Girshick R, Donahue J, Darrell T, Malik J (2014) Rich feature hierarchies for accurate object detection and semantic segmentation. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition pp 580–587
He K, Zhang X, Ren S, Sun J (2015) Spatial pyramid pooling in deep convolutional networks for visual recognition. IEEE Trans Pattern Anal Mach Intell 37(9):1904–1916
Ren S, He K, Girshick R, Sun J (2015) Faster r-CNN: towards real-time object detection with region proposal networks. Adv Neural Inf Process Syst 28
Liu W, Anguelov D, Erhan D, Szegedy C, Reed S, Fu CY, Berg AC (2016) SSD: Single shot multibox detector. In: Computer Vision–ECCV 2016: 14th European Conference, Amsterdam, The Netherlands, October 11–14, 2016, Proceedings, Part I 14, pp 21–37. Springer
Redmon J, Divvala S, Girshick R, Farhadi A (2016) You only look once: unified, real-time object detection. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition pp 779–788
Redmon J, Farhadi A (2017) YOLO9000: better, faster, stronger. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition pp 7263–7271
Redmon J, Farhadi A (2018) YOLO3: an incremental improvement. arXiv preprint arXiv:1804.02767
Bochkovskiy A, Wang CY, Liao HYM (2020) YOLO4: optimal speed and accuracy of object detection. arXiv preprint arXiv:2004.10934
Li C, Li L, Jiang H, Weng K, Geng Y, Li L, Ke Z, Li Q, Cheng M, Nie W et al. (2022) Yolov6: a single-stage object detection framework for industrial applications. arXiv preprint arXiv:2209.02976
Wang CY, Bochkovskiy A, Liao HYM (2023) YOLOv7: trainable bag-of-freebies sets new state-of-the-art for real-time object detectors. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition pp 7464–7475
Adibhatla VA, Chih HC, Hsu CC, Cheng J, Abbod MF, Shieh JS (2021) Applying deep learning to defect detection in printed circuit boards via a newest model of you-only-look-once
Chen W, Huang Z, Mu Q, Sun Y (2022) PCB defect detection method based on transformer-yolo. IEEE Access 10:129480–129489
Tang J, Liu S, Zhao D, Tang L, Zou W, Zheng B (2023) PCB-YOLO: An improved detection algorithm of PCB surface defects based on YOLOv5. Sustainability 15(7):5963
Du B, Wan F, Lei G, Xu L, Xu C, Xiong Y (2023) YOLO-MBBi: PCB surface defect detection method based on enhanced YOLOv5. Electronics 12(13):2821
Ye M, Wang H, Xiao H (2023) Light-YOLOv5: a lightweight algorithm for improved YOLOv5 in PCB defect detection. In: 2023 IEEE 2nd International Conference on Electrical Engineering, Big Data and Algorithms (EEBDA), pp. 523–528. IEEE
Li D, Xu A, Yu X (2023) Optimized lightweight PCB real-time defect detection algorithm. In: 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI) pp 262–269. IEEE
Qian X, Wang X, Yang S, Lei J (2022) LFF-YOLO: a YOLO algorithm with lightweight feature fusion network for multi-scale defect detection. IEEE Access 10:130339–130349
Hartigan JA, Wong MA (1979) Algorithm as 136: a k-means clustering algorithm. J R Stat Soc Ser C Appl Stat 28(1):100–108
Chen J, Kao SH, He H, Zhuo W, Wen S, Lee CH, Chan SHG (2023) Run, don’t walk: chasing higher flops for faster neural networks. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition pp 12021–12031
Han K, Wang Y, Tian Q, Guo J, Xu C, Xu C (2020) GhostNet: More features from cheap operations. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition pp 1580–1589
Li H, Li J, Wei H, Liu Z, Zhan Z, Ren Q (2022) Slim-neck by GSConv: a better design paradigm of detector architectures for autonomous vehicles. arXiv preprint arXiv:2206.02424
Gevorgyan Z (2022) SIoU loss: more powerful learning for bounding box regression. arXiv preprint arXiv:2205.12740
Yang L, Zhou X, Li X, Qiao L, Li Z, Yang Z, Wang G, Li X (2023) Bridging cross-task protocol inconsistency for distillation in dense object detection. In: Proceedings of the IEEE/CVF International Conference on Computer Vision pp 17175–17184
Malinin A, Gales M (2019) Reverse KL-divergence training of prior networks: improved uncertainty and adversarial robustness. Adv Neural Inf Process Syst 32
Lee J, Park S, Mo S, Ahn S, Shin J (2020) Layer-adaptive sparsity for the magnitude-based pruning. arXiv preprint arXiv:2010.07611
Ding R, Dai L, Li G, Liu H (2019) TDD-net: a tiny defect detection network for printed circuit boards. CAAI Trans Intell Technol 4(2):110–116
Kisantal M, Wojna Z, Murawski J, Naruniec J, Cho, K (2019) Augmentation for small object detection. arXiv preprint arXiv:1902.07296
Howard A, Sandler M, Chu G, Chen LC, Chen B, Tan M, Wang W, Zhu Y, Pang R, Vasudevan V et al. (2019) Searching for MobileNetv3. In: Proceedings of the IEEE/CVF International Conference on Computer Vision pp 1314–1324
Ma N, Zhang X, Zheng H-T, Sun J (2018) ShuffleNet V2: Practical guidelines for efficient CNN architecture design. In: Proceedings of the European Conference on Computer Vision (ECCV) pp 116–131
Fang G, Ma X, Song M, Mi MB, Wang X (2023) Depgraph: towards any structural pruning. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition pp 16091–16101
Shu C, Liu Y, Gao J, Yan Z, Shen C (2021) Channel-wise knowledge distillation for dense prediction. In: Proceedings of the IEEE/CVF International Conference on Computer Vision pp 5311–5320
Yang Z, Li Z, Shao M, Shi D, Yuan Z, Yuan C (2022) Masked generative distillation. In: European Conference on Computer Vision pp 53–69. Springer
Glučina M, Anj̣elić N, Lorencin I, Car Z (2023) Detection and classification of printed circuit boards using YOLO algorithm. Electronics 12(3):667
Ling Q, Isa NAM, Asaari MSM (2023) Precise detection for dense PCB components based on modified YOLOv8. IEEE Access
Long Y, Li Z, Cai Y, Zhang R, Shen K (2023) PCB defect detection algorithm based on improved YOLOv8. Acad J Sci Technol 7(3):297–304
Zhang L, Chen J, Chen J, Wen Z, Zhou X (2024) LDD-Net: lightweight printed circuit board defect detection network fusing multi-scale features. Eng Appl Artif Intell 129:107628
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This work was supported by the Key Projects for Postgraduate Students of Hunan Provincial Department of Education (No. CX20210742).
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An earlier version of this work, titled "ASTKD-PCB-LDD: A Lightweight High Performance PCB Defect Detection Algorithm," was published as a preprint on Research Square (DOI: https://doi.org/10.21203/rs.3.rs-4008736/v1). This manuscript includes important revisions and additional experimental results that were not part of the preprint.
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Hu, Z., Zhang, Z., Liu, S. et al. ASTKD-PCB-LDD: high-performance PCB defect detection model with align soft-target knowledge distillation and lightweight network design. J Supercomput 81, 531 (2025). https://doi.org/10.1007/s11227-025-07045-9
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DOI: https://doi.org/10.1007/s11227-025-07045-9